scholarly journals Transforming a surface state of a topological insulator by a Bi capping layer

2014 ◽  
Vol 90 (23) ◽  
Author(s):  
Han Woong Yeom ◽  
Sung Hwan Kim ◽  
Woo Jong Shin ◽  
Kyung-Hwan Jin ◽  
Joonbum Park ◽  
...  
2018 ◽  
Vol 2 (10) ◽  
Author(s):  
K. Sumida ◽  
T. Natsumeda ◽  
K. Miyamoto ◽  
I. V. Silkin ◽  
K. Kuroda ◽  
...  

2014 ◽  
Vol 105 (24) ◽  
pp. 241605 ◽  
Author(s):  
Kumar Virwani ◽  
Sara E. Harrison ◽  
Aakash Pushp ◽  
Teya Topuria ◽  
Eugene Delenia ◽  
...  

2020 ◽  
Vol 6 (33) ◽  
pp. eaaz8463
Author(s):  
Chao-Yao Yang ◽  
Lei Pan ◽  
Alexander J. Grutter ◽  
Haiying Wang ◽  
Xiaoyu Che ◽  
...  

This work reports the ferromagnetism of topological insulator, (Bi,Sb)2Te3 (BST), with a Curie temperature of approximately 120 K induced by magnetic proximity effect (MPE) of an antiferromagnetic CrSe. The MPE was shown to be highly dependent on the stacking order of the heterostructure, as well as the interface symmetry: Growing CrSe on top of BST results in induced ferromagnetism, while growing BST on CrSe yielded no evidence of an MPE. Cr-termination in the former case leads to double-exchange interactions between Cr3+ surface states and Cr2+ bulk states. This Cr3+-Cr2+ exchange stabilizes the ferromagnetic order localized at the interface and magnetically polarizes the BST Sb band. In contrast, Se-termination at the CrSe/BST interface yields no detectable MPE. These results directly confirm the MPE in BST films and provide critical insights into the sensitivity of the surface state.


2013 ◽  
Vol 103 (19) ◽  
pp. 193107 ◽  
Author(s):  
Bacel Hamdou ◽  
Johannes Gooth ◽  
August Dorn ◽  
Eckhard Pippel ◽  
Kornelius Nielsch

2015 ◽  
Vol 5 (1) ◽  
Author(s):  
Jihwey Park ◽  
Yeong-Ah Soh ◽  
Gabriel Aeppli ◽  
Xiao Feng ◽  
Yunbo Ou ◽  
...  

Abstract Thin films of topological insulators are often capped with an insulating layer since topological insulators are known to be fragile to degradation. However, capping can hinder the observation of novel transport properties of the surface states. To understand the influence of capping on the surface states, it is crucial to understand the crystal structure and the atomic arrangement at the interfaces. Here, we use x-ray diffraction to establish the crystal structure of magnetic topological insulator Cr-doped (Bi,Sb)2Te3 (CBST) films grown on SrTiO3 (1 1 1) substrates with and without a Te capping layer. We find that both the film and capping layer are single crystal and that the crystal quality of the film is independent of the presence of the capping layer, but that x-rays cause sublimation of the CBST film, which is prevented by the capping layer. Our findings show that the different transport properties of capped films cannot be attributed to a lower crystal quality but to a more subtle effect such as a different electronic structure at the interface with the capping layer. Our results on the crystal structure and atomic arrangements of the topological heterostructure will enable modelling the electronic structure and design of topological heterostructures.


2016 ◽  
Vol 6 (1) ◽  
Author(s):  
I. P. Rusinov ◽  
T. V. Menshchikova ◽  
A. Isaeva ◽  
S. V. Eremeev ◽  
Yu. M. Koroteev ◽  
...  

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