scholarly journals Measurement of the spatial extent of inverse proximity in a Py/Nb/Py superconducting trilayer using low-energy muon-spin rotation

2014 ◽  
Vol 89 (5) ◽  
Author(s):  
M. G. Flokstra ◽  
S. J. Ray ◽  
S. J. Lister ◽  
J. Aarts ◽  
H. Luetkens ◽  
...  
2020 ◽  
Vol 1004 ◽  
pp. 581-586
Author(s):  
Judith Woerle ◽  
Thomas Prokscha ◽  
Ulrike Grossner

In this work, the potential of muon spin rotation (μSR) with low-energy muons (LE-μ) for the investigation of oxidation-induced defects at the SiO2/4H-SiC interface is explored. By using implantation energies for the muons in the keV range and comparing the fractions of muonium in different regions, the depth distribution of defects in the first 200 nm of the target material can be resolved. Defect profiles of interfaces with either deposited or thermally grown SiO2 layers on 4H-SiC are compared. The results show an increased number of defects in the case of a thermal oxide, both on the oxide and on the SiC side of the interface, with a spatial extension of a few tens of nm.


2012 ◽  
Vol 85 (2) ◽  
Author(s):  
B. M. Wojek ◽  
E. Morenzoni ◽  
D. G. Eshchenko ◽  
A. Suter ◽  
T. Prokscha ◽  
...  

2008 ◽  
Vol 100 (14) ◽  
Author(s):  
E. Morenzoni ◽  
H. Luetkens ◽  
T. Prokscha ◽  
A. Suter ◽  
S. Vongtragool ◽  
...  

2000 ◽  
Vol 12 (7) ◽  
pp. 1399-1411 ◽  
Author(s):  
T J Jackson ◽  
C Binns ◽  
E M Forgan ◽  
E Morenzoni ◽  
Ch Niedermayer ◽  
...  

2013 ◽  
Vol 88 (6) ◽  
Author(s):  
E. Stilp ◽  
A. Suter ◽  
T. Prokscha ◽  
E. Morenzoni ◽  
H. Keller ◽  
...  

2000 ◽  
Vol 289-290 ◽  
pp. 326-330 ◽  
Author(s):  
H Luetkens ◽  
J Korecki ◽  
H Glückler ◽  
E Morenzoni ◽  
T Prokscha ◽  
...  

2017 ◽  
Vol 30 (12) ◽  
pp. 125013 ◽  
Author(s):  
Tobias Junginger ◽  
S Calatroni ◽  
A Sublet ◽  
G Terenziani ◽  
T Prokscha ◽  
...  

1999 ◽  
Vol 59 (5) ◽  
pp. 3775-3782 ◽  
Author(s):  
Th. Jestädt ◽  
K. H. Chow ◽  
S. J. Blundell ◽  
W. Hayes ◽  
F. L. Pratt ◽  
...  

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