scholarly journals Characterization of low-frequency noise in the resistive switching of transition metal oxide HfO2

2012 ◽  
Vol 85 (4) ◽  
Author(s):  
Shimeng Yu ◽  
Rakesh Jeyasingh ◽  
Yi Wu ◽  
H.-S. Philip Wong
Keyword(s):  
Transition Metal ◽  
Metal Oxide ◽  
Resistive Switching ◽  
Low Frequency ◽  
Transition Metal Oxide ◽  
Frequency Noise ◽  
Low Frequency Noise

Using low-frequency noise characterization of AlGaN/GaN HEMT as a tool for technology assessment and failure prediction

2004 ◽  
Author(s):  
Jean-Guy Tartarin ◽  
Geoffroy Soubercaze-Pun ◽  
Abdelali Rennane ◽  
Laurent Bary ◽  
Robert Plana ◽  
...  
Keyword(s):  
Technology Assessment ◽  
Low Frequency ◽  
Failure Prediction ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Gan Hemt ◽  
Noise Characterization

scholarly journals Relationship between Resistive Switching Effect and Secondary Electron Yield in Transition Metal Oxide Films

Hyomen Kagaku ◽  
2011 ◽  
Vol 32 (7) ◽  
pp. 422-427
Author(s):  
Takatoshi YODA ◽  
Kentaro KINOSHITA ◽  
Kazufumi DOBASHI ◽  
Kenichi KITAMURA ◽  
Satoru KISHIDA
Keyword(s):  
Transition Metal ◽  
Metal Oxide ◽  
Resistive Switching ◽  
Secondary Electron ◽  
Oxide Films ◽  
Transition Metal Oxide ◽  
Switching Effect ◽  
Metal Oxide Films ◽  
Secondary Electron Yield ◽  
Resistive Switching Effect

scholarly journals Characterization of Low-Frequency Noise of MOSFETs Using 2-D Device Simulator

2001 ◽  
pp. 400-403
Author(s):  
Hyunchul Nah ◽  
Young June Park ◽  
Hong-Shick Min ◽  
Chanho Lee ◽  
Hyungsoon Shin
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise
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