scholarly journals Jaynes-Cummings treatment of superconducting resonators with dielectric loss due to two-level systems

2011 ◽  
Vol 84 (10) ◽  
Author(s):  
M. Bhattacharya ◽  
K. D. Osborn ◽  
Ari Mizel
Keyword(s):  
Dielectric Loss ◽  
Superconducting Resonators ◽  
Two Level Systems

scholarly journals Dynamical decoupling of quantum two-level systems by coherent multiple Landau–Zener transitions

2019 ◽  
Vol 5 (1) ◽  
Author(s):  
Shlomi Matityahu ◽  
Hartmut Schmidt ◽  
Alexander Bilmes ◽  
Alexander Shnirman ◽  
Georg Weiss ◽  
...  
Keyword(s):  
Dielectric Loss ◽  
Single Photon ◽  
Intrinsic Value ◽  
Bias Field ◽  
Quantum Circuits ◽  
Periodic Pattern ◽  
Superconducting Resonators ◽  
Highly Sensitive ◽  
Two Level Systems ◽  
Temperature Radiation

AbstractIncreasing and stabilizing the coherence of superconducting quantum circuits and resonators is of utmost importance for various technologies, ranging from quantum information processors to highly sensitive detectors of low-temperature radiation in astrophysics. A major source of noise in such devices is a bath of quantum two-level systems (TLSs) with broad distribution of energies, existing in disordered dielectrics and on surfaces. Here we study the dielectric loss of superconducting resonators in the presence of a periodic electric bias field, which sweeps near-resonant TLSs in and out of resonance with the resonator, resulting in a periodic pattern of Landau–Zener transitions. We show that at high sweep rates compared to the TLS relaxation rate, the coherent evolution of the TLS over multiple transitions yields a significant reduction in the dielectric loss relative to the intrinsic value. This behavior is observed both in the classical high-power regime and in the quantum single-photon regime, possibly suggesting a viable technique to dynamically decouple TLSs from a qubit.

scholarly journals Strain-spectroscopy of strongly interacting defects in superconducting qubits

2021 ◽  
Author(s):  
Octavio de los Santos ◽  
Ricardo Roman Ancheyta
Keyword(s):  
Spectral Response ◽  
Actual State ◽  
Tunnel Barrier ◽  
Superconducting Resonators ◽  
Quantum Devices ◽  
Material Defects ◽  
Spectral Signatures ◽  
Strongly Interacting ◽  
Two Level Systems ◽  
Theoretical Insight

Abstract The proper functioning of some micro-fabricated novel quantum devices, such as superconducting resonators and qubits, is severely affected by the presence of parasitic structural material defects known as tunneling two-level-systems (TLS). Recent experiments have reported unambiguous evidence of the strong interaction between individual (coherent) TLS using strain-assisted spectroscopy. This work provides an alternative and simple theoretical insight that illustrates how to obtain the spectral response of such strongly interacting defects residing inside the amorphous tunnel barrier of a qubit's Josephson junction. Moreover, the corresponding spectral signatures obtained here may serve to quickly and efficiently elucidate the actual state of these interacting TLS in experiments based on strain- or electric-field spectroscopy.

scholarly journals Comparison of dielectric loss in titanium nitride and aluminum superconducting resonators

2020 ◽  
Vol 117 (12) ◽  
pp. 124004
Author(s):  
A. Melville ◽  
G. Calusine ◽  
W. Woods ◽  
K. Serniak ◽  
E. Golden ◽  
...  
Keyword(s):  
Dielectric Loss ◽  
Titanium Nitride ◽  
Superconducting Resonators

DIELECTRIC EVIDENCE FOR EXISTENCE OF TWO-LEVEL-SYSTEMS IN CYCLOHEXANOL, A " GLASSY CRYSTAL " SYSTEM

1982 ◽  
Vol 43 (C9) ◽  
pp. C9-525-C9-527
Author(s):  
G. P. Singh ◽  
R. Vacher ◽  
R. Calemczuk
Keyword(s):  
Crystal System ◽  
Two Level Systems

MECHANICAL AND DIELECTRIC LOSS SPECTRA OF AMBERS

1985 ◽  
Vol 46 (C10) ◽  
pp. C10-565-C10-568
Author(s):  
M. WELLER ◽  
C. A. WERT ◽  
D. SCHLEE
Keyword(s):  
Dielectric Loss

Sparse Representation Based Dielectric Loss Angle Measurement

2015 ◽  
Vol 9 (1) ◽  
pp. 566-570
Author(s):  
Zhang Ji ◽  
Jianfeng Zheng
Keyword(s):  
Dielectric Loss ◽  
Power Systems ◽  
Sparse Representation ◽  
Precise Measurement ◽  
Angle Measurement ◽  
Measuring Error ◽  
Loss Angle ◽  
Analysis Method ◽  
Electric Capacity ◽  
Dielectric Loss Angle

Precise measurement of dielectric loss angle is very important for electric capacity equipment in recent power systems. When signal-to-noise is low and fundamental frequency is fluctuating, aiming at the measuring error of dielectric loss angle based on some recent Fourier transform and wavelet transform harmonics analysis method, we propose a novel algorithm based on sparse representation, and improved it to be more flexible for signal sampling. Comparison experiments describe the advantages of our method.

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