scholarly journals Analytical model of the nonlinear dynamics of cantilever tip-sample surface interactions for various acoustic atomic force microscopies

2008 ◽  
Vol 77 (16) ◽  
Author(s):  
John H. Cantrell ◽  
Sean A. Cantrell
Keyword(s):  
Nonlinear Dynamics ◽  
Analytical Model ◽  
Sample Surface ◽  
Surface Interactions ◽  
Atomic Force

scholarly journals Измерения контактной жесткости в атомно-силовом микроскопе

2020 ◽  
Vol 90 (11) ◽  
pp. 1951
Author(s):  
А.В. Анкудинов ◽  
М.М. Халисов
Keyword(s):  
Atomic Force Microscope ◽  
Analytical Model ◽  
Contact Interaction ◽  
Relative Position ◽  
Mechanical Characteristics ◽  
Contact Stiffness ◽  
Sample Surface ◽  
Atomic Force ◽  
Imaging Mode ◽  
Cantilever Probe

A method is proposed for increasing the accuracy of nanomechanical measurements in an atomic force microscope. To describe the contact interaction of the cantilever with the sample, an analytical model was used that takes into account the following factors: the cantilever probe sticks to the sample surface or slides along it, the geometric and mechanical characteristics of the sample and cantilever, and their relative position. Under the assumption of sliding, a filter was developed to correct the signals of contact stiffness and deformation measured on a sample with a developed relief. The use of the filter is illustrated in images obtained in an atomic force microscope with an imaging mode based on point-by-point registration of the force quasistatic interaction of the cantilever probe with the sample.

scholarly journals Reconstruction of tip-surface interactions with multimodal intermodulation atomic force microscopy

2013 ◽  
Vol 88 (11) ◽  
Author(s):  
Stanislav S. Borysov ◽  
Daniel Platz ◽  
Astrid S. de Wijn ◽  
Daniel Forchheimer ◽  
Eric A. Tolén ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Interactions ◽  
Force Microscopy ◽  
Atomic Force

Characterization of Multi-Phase and Multi-Component Polymer Systems Using the Atomic Force Microscope

1999 ◽  
Vol 5 (S2) ◽  
pp. 962-963
Author(s):  
M. VanLandingham ◽  
X. Gu ◽  
D. Raghavan ◽  
T. Nguyen
Keyword(s):  
Energy Dissipation ◽  
Atomic Force Microscope ◽  
Mechanical Response ◽  
Sample Surface ◽  
Phase Changes ◽  
Phase Imaging ◽  
Polymer Systems ◽  
Atomic Force ◽  
Phase Images ◽  
Multi Phase

Recent advances have been made on two fronts regarding the capability of the atomic force microscope (AFM) to characterize the mechanical response of polymers. Phase imaging with the AFM has emerged as a powerful technique, providing contrast enhancement of topographic features in some cases and, in other cases, revealing heterogeneities in the polymer microstructure that are not apparent from the topographic image. The enhanced contrast provided by phase images often allows for identification of different material constituents. However, while the phase changes of the oscillating probe are associated with energy dissipation between the probe tip and the sample surface, the relationship between this energy dissipation and the sample properties is not well understood.As the popularity of phase imaging has grown, the capability of the AFM to measure nanoscale indentation response of polymers has also been explored. Both techniques are ideal for the evaluation of multi-phase and multi-component polymer systems.

Tip–surface interactions in noncontact atomic force microscopy on reactive surfaces

2000 ◽  
Vol 64 (3-8) ◽  
pp. 179-191 ◽  
Author(s):  
I. Štich ◽  
J. Tóbik ◽  
R. Pérez ◽  
K. Terakura ◽  
S.H. Ke
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Interactions ◽  
Force Microscopy ◽  
Atomic Force ◽  
Reactive Surfaces

Acquisition of High Precision Images for Non-Contact Atomic Force Microscopy via Direct Identification of Sample Height

2005 ◽  
Author(s):  
H. N. Pishkenari ◽  
Nader Jalili ◽  
A. Meghdari
Keyword(s):  
High Precision ◽  
Single Mode ◽  
Scanning Speed ◽  
Sample Surface ◽  
Biological Species ◽  
Atomic Scale ◽  
Contact Mode ◽  
Practical Applications ◽  
Atomic Force ◽  
Sample Height

Atomic force microscopes (AFM) can image and manipulate sample properties at the atomic scale. The non-contact mode of AFM offers unique advantages over other contemporary scanning probe techniques, especially when utilized for reliable measurements of soft samples (e.g., biological species). The distance between cantilever tip and sample surface is a time varying parameter even for a fixed sample height, and hence, difficult to identify. A remedy to this problem is to directly identify the sample height in order to generate high precision, atomic-resolution images. For this, the microcantilever is modeled by a single mode approximation and the interaction between the sample and cantilever is derived from a van der Waals potential. Since in most practical applications only the microcantilever deflection is accessible, this measurement is utilized to identify the sample height in each point. Using the proposed approach for identification of the sample height, the scanning speed can be increased significantly. Furthermore, for taking atomic-scale images of atomically flat samples, there is no need to use the feedback loop to achieve setpoint amplitude. Simulation results are provided to demonstrate the effectiveness of the approach and suggest the most suitable technique for the sample height identification.

scholarly journals Nonlinear dynamics for estimating the tip radius in atomic force microscopy

2017 ◽  
Vol 111 (12) ◽  
pp. 123105 ◽  
Author(s):  
E. Rull Trinidad ◽  
T. W. Gribnau ◽  
P. Belardinelli ◽  
U. Staufer ◽  
F. Alijani
Keyword(s):  
Nonlinear Dynamics ◽  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Tip Radius

Tip-surface interactions studied using a force controlled atomic force microscope in ultrahigh vacuum

1997 ◽  
Vol 70 (17) ◽  
pp. 2238-2240 ◽  
Author(s):  
S. P. Jarvis ◽  
S.-I. Yamamoto ◽  
H. Yamada ◽  
H. Tokumoto ◽  
J. B. Pethica
Keyword(s):  
Atomic Force Microscope ◽  
Ultrahigh Vacuum ◽  
Surface Interactions ◽  
Atomic Force
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