scholarly journals Nonlinear Dynamics of Cantilever Tip-Sample Surface Interactions in Atomic Force Microscopy

10.5772/6945 ◽  
2010 ◽  
Author(s):  
John H. ◽  
Sean A.
Keyword(s):  
Nonlinear Dynamics ◽  
Atomic Force Microscopy ◽  
Sample Surface ◽  
Surface Interactions ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Reconstruction of tip-surface interactions with multimodal intermodulation atomic force microscopy

2013 ◽  
Vol 88 (11) ◽  
Author(s):  
Stanislav S. Borysov ◽  
Daniel Platz ◽  
Astrid S. de Wijn ◽  
Daniel Forchheimer ◽  
Eric A. Tolén ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Interactions ◽  
Force Microscopy ◽  
Atomic Force

Tip–surface interactions in noncontact atomic force microscopy on reactive surfaces

2000 ◽  
Vol 64 (3-8) ◽  
pp. 179-191 ◽  
Author(s):  
I. Štich ◽  
J. Tóbik ◽  
R. Pérez ◽  
K. Terakura ◽  
S.H. Ke
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Interactions ◽  
Force Microscopy ◽  
Atomic Force ◽  
Reactive Surfaces

scholarly journals Nonlinear dynamics for estimating the tip radius in atomic force microscopy

2017 ◽  
Vol 111 (12) ◽  
pp. 123105 ◽  
Author(s):  
E. Rull Trinidad ◽  
T. W. Gribnau ◽  
P. Belardinelli ◽  
U. Staufer ◽  
F. Alijani
Keyword(s):  
Nonlinear Dynamics ◽  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Tip Radius

Role of Covalent Tip-Surface Interactions in Noncontact Atomic Force Microscopy on Reactive Surfaces

1997 ◽  
Vol 78 (4) ◽  
pp. 678-681 ◽  
Author(s):  
Rubén Pérez ◽  
Michael C. Payne ◽  
Ivan Štich ◽  
Kiyoyuki Terakura
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Interactions ◽  
Force Microscopy ◽  
Atomic Force ◽  
Reactive Surfaces

Sufficient condition for reliability measurement of sample geometry by atomic force microscopy

2020 ◽  
pp. 11-15
Author(s):  
Alexander S. Kravchuk ◽  
Anzhelika I. Kravchuk
Keyword(s):  
Atomic Force Microscopy ◽  
Preliminary Investigation ◽  
Sample Surface ◽  
Sufficient Condition ◽  
Surface Geometry ◽  
Force Microscopy ◽  
Atomic Force ◽  
Geometric Deviations ◽  
Reliability Measurement ◽  
Microscope Stage

A sufficient condition for determining the reliability of geometry measurements using atomic force microscopy for relatively small cantilever tilt angles is proposed. A relationship between the basic geometric parameters of surface roughness, geometric deviations of the probe, the angles of the cantilever and the inclination of the side faces of the probe, as well as the dimensions of the nonlocal point of the probable contact of its side faces with protrusions of roughness has been established. As a sufficient condition for the reliability of geometry measurements using atomic force microscopy, an obvious requirement is accepted. It determines the smallness of the ratio of the sizes of a nonlocal point to the distance between neighboring nonlocal points. Publications in which the measurement of surface nano-geometry of the samples does not indicate the roughness of the sample surface and the probe, the angles at the tip of the probe and the tilt of the cantilever, as well as the best resolution (smallest step) at which the study is carried out, cannot be accepted as reliable, because the results obtained in them are probabilistic in nature. The surface images obtained using atomic force microscopy without proper justification for the resolution (value of the measurement step) represent only a qualitative picture, on the basis of which it makes no sense to carry out any computational manipulations. In order to increase the reliability of measurements of surface geometry using atomic force microscopy, it is necessary to radically increase the accuracy of the manufacture of probes, as well as use probes with the smallest possible angle at the apex. In addition, it is necessary to make changes in the design of the atomic force microscopy. In particular, the automatic rotation of the microscope stage should be designed. It should provide closeness the probe axis direction to the normal to the average plane of the sample. This “integral” angle of rotation of the microscope stage is easily iteratively determined at the stage of preliminary investigation of the geometry of the surface of the sample. In this case, it will be necessary to geometrically increase the length of the cantilever so that the base extends beyond the limits of the sample.

Features of the Manufacturing Process of Silicon Tips for Cantilevers

2021 ◽  
Vol 26 (3-4) ◽  
pp. 234-245
Author(s):  
A.V. Novak ◽  
◽  
V.R. Novak ◽  
A.V. Rumyantsev ◽  
◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Silicon Film ◽  
Statistical Parameter ◽  
Sample Surface ◽  
Test Sample ◽  
Oxygen Atmosphere ◽  
Maximum Height ◽  
Force Microscopy ◽  
Atomic Force ◽  
Crystallographic Planes

Sample surface examination in atomic force microscopy is carried out using cantilevers having the form of elastic consoles with sharp needle (tip) at the free end. Quality of images obtained from atomic force microscope (AFM) heavily depends on tip sharpness degree. Silicon cantilevers made based on wet anisotropic etching are widely used in atomic force microscopy. This paper studies the dependence of the shape and size of the resulting tip on the concentration of KOH in the solution, as well as the effect of pyrogenic oxidation and oxidation in a dry oxygen atmosphere on the sharpness of the tip during the sharpening process. It was shown that when 70 % concentration is used, tips with the highest aspect ratio and maximum height are obtained. In this case, the shape of the needle is an octagonal pyramid, the lateral faces of which are formed by eight crystallographic planes from {311} and {131}. It was found that in a two-stage sharpening process, consisting of pyrogenic oxidation and oxidation in a dry oxygen atmosphere, it is possible to form sufficiently sharp probes with a tip radius of 2–5 nm and an apex angle of 14–24°. It has been established that a one-stage sharpening process based on pyrogenic oxidation provides only the production of probes with a radius of about 14 nm. Comparative tests of the manufactured probes in obtaining AFM images of a test sample of a polycrystalline silicon film with hemispherical grains (HSG-Si) were presented. Research study has revealed that such a statistical parameter as the relative increment of the surface area Sdr is the most sensitive to probe sharpness for surfaces of the HSG-Si film type.

Sign in / Sign up

Export Citation Format

Share Document