scholarly journals Nonlinear dynamics for estimating the tip radius in atomic force microscopy

2017 ◽  
Vol 111 (12) ◽  
pp. 123105 ◽  
Author(s):  
E. Rull Trinidad ◽  
T. W. Gribnau ◽  
P. Belardinelli ◽  
U. Staufer ◽  
F. Alijani
Keyword(s):  
Nonlinear Dynamics ◽  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Tip Radius

A method to provide rapid in situ determination of tip radius in dynamic atomic force microscopy

2012 ◽  
Vol 83 (4) ◽  
pp. 043707 ◽  
Author(s):  
Sergio Santos ◽  
Li Guang ◽  
Tewfik Souier ◽  
Karim Gadelrab ◽  
Matteo Chiesa ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Tip Radius

Nonlinear Tapping-Tip Dynamics in Atomic Force Microscopy

2002 ◽  
Author(s):  
Soo Il Lee ◽  
Arvind Raman ◽  
Shuiqing Hu ◽  
Stephen W. Howell ◽  
Ron Reifenberger
Keyword(s):  
Nonlinear Dynamics ◽  
Atomic Force Microscopy ◽  
Nonlinear Response ◽  
Excitation Frequency ◽  
Computational Tools ◽  
Force Microscopy ◽  
Atomic Force ◽  
Highly Nonlinear ◽  
Intermittent Contact ◽  
Resolution Imaging

Tapping or intermittent contact atomic force microscopy (AFM) is widely used scanning probe techniques for high resolution imaging, manipulation and nanolithography. The presence of van der Waals forces and nanoscale impacts render highly nonlinear the dynamics of the AFM microcantilever while it operates in the tapping mode. A comprehensive nonlinear analysis of the nonlinear dynamics of AFM microcantilevers tapping on a nanostructure using the theoretical and computational tools of modern nonlinear dynamics has not yet been presented. Also, a rational connection between certain features of the tip-sample interaction potential and the nonlinear response has not been established satisfactorily. To address this problem, we have combined both experimental and nonlinear computational analysis of the tapping response of a microcantilever as a function of the excitation frequency. We show that this approach enables a comprehensive understanding of the nonlinear dynamic behavior observed in AFM experiments.

Nonlinear Dynamics and Control of the Scan Process in Noncontacting Atomic Force Microscopy

2005 ◽  
Author(s):  
S. Hornstein ◽  
O. Gottlieb ◽  
L. Ioffe
Keyword(s):  
Nonlinear Dynamics ◽  
Atomic Force Microscopy ◽  
Numerical Study ◽  
Initial Boundary ◽  
Atomic Interaction ◽  
Force Microscopy ◽  
Atomic Force ◽  
Dynamics And Control ◽  
And Control ◽  
Nonlinear Dynamics And Control

The focus of this paper is on the nonlinear dynamics and control of the scan process in noncontacting atomic force microscopy. An initial-boundary-value problem is consistently formulated to include both nonlinear dynamics of a microcantilever with a localized atomic interaction force for the surface it is mapping, and a horizontal boundary condition for a constant scan speed and its control. The model considered is obtained using the extended Hamilton’s principle which yields two partial differential equations for the combined horizontal and vertical motions. Isolation of a Lagrange multiplier describing the microbeam fixed length enables construction of a modified equation of motion which is reduced to a single mode dynamical system via Galerkin’s method. The analysis includes a numerical study of the strongly nonlinear system leading to a stability map describing an escape bifurcation threshold where the tip, at the free end of the microbeam, ‘jumps-to-contact’ with the sample. Results include periodic ultrasubharmonic and quasiperiodic solutions corresponding to primary and secondary resonances.

scholarly journals Effect of Eigenmode Frequency on Loss Tangent Atomic Force Microscopy Measurements

2021 ◽  
Vol 11 (15) ◽  
pp. 6813
Author(s):  
Babak Eslami ◽  
Dylan Caputo
Keyword(s):  
Atomic Force Microscopy ◽  
Loss Tangent ◽  
Oscillation Amplitude ◽  
Excitation Frequency ◽  
Chemical Properties ◽  
Sample Surface ◽  
Force Microscopy ◽  
Atomic Force ◽  
Afm Cantilever ◽  
Tip Radius

Atomic Force Microscopy (AFM) is no longer used as a nanotechnology tool responsible for topography imaging. However, it is widely used in different fields to measure various types of material properties, such as mechanical, electrical, magnetic, or chemical properties. One of the recently developed characterization techniques is known as loss tangent. In loss tangent AFM, the AFM cantilever is excited, similar to amplitude modulation AFM (also known as tapping mode); however, the observable aspects are used to extract dissipative and conservative energies per cycle of oscillation. The ratio of dissipation to stored energy is defined as tanδ. This value can provide useful information about the sample under study, such as how viscoelastic or elastic the material is. One of the main advantages of the technique is the fact that it can be carried out by any AFM equipped with basic dynamic AFM characterization. However, this technique lacks some important experimental guidelines. Although there have been many studies in the past years on the effect of oscillation amplitude, tip radius, or environmental factors during the loss tangent measurements, there is still a need to investigate the effect of excitation frequency during measurements. In this paper, we studied four different sets of samples, performing loss tangent measurements with both first and second eigenmode frequencies. It is found that performing these measurements with higher eigenmode is advantageous, minimizing the tip penetration through the surface and therefore minimizing the error in loss tangent measurements due to humidity or artificial dissipations that are not dependent on the actual sample surface.

Compositional Mapping in Dynamic Atomic Force Microscopy in High-Q vs. Low-Q Environments: Effects of Cantilever Nonlinear Dynamics

2010 ◽  
Author(s):  
John Melcher ◽  
Arvind Raman
Keyword(s):  
Nonlinear Dynamics ◽  
Atomic Force Microscopy ◽  
Quality Factors ◽  
Force Microscopy ◽  
High Q ◽  
New Class ◽  
Atomic Force ◽  
Nanoscale Metrology ◽  
Q Factors ◽  
Local Stiffness

The ability to simultaneously map variations in topography and composition (local stiffness, adhesion, charge, hydrophillicity/phobicity, viscoelasticity) of samples in ambient and liquid environments has made dynamic atomic force microscopy (dAFM) a powerful tool for nanoscale metrology. In ambient and vacuum environments, quality factors (Q-factors) of the fundamental resonance are typically large, and the contrast channels in dAFM are relatively well understood. In liquid environments, however, Q-factors are typically low due to cantilever interactions with the surrounding viscous liquid, which introduces a new class of nonlinear dynamics that is accompanied by new contrast channels, such as, higher harmonic amplitudes and phases. In particular, we find that the interpretation of the traditional contrast channels is quite different in low-Q environments compared to high-Q environments. We present a theoretical investigation of the contrast channels in dAFM in the context of frequency modulation and tapping mode dAFM with an emphasis on low-Q environments.

Sign in / Sign up

Export Citation Format

Share Document