Effect of growth orientation and surface roughness on electron transport in silicon nanowires

2007 ◽  
Vol 75 (12) ◽  
Author(s):  
Alexei Svizhenko ◽  
Paul W. Leu ◽  
Kyeongjae Cho
Keyword(s):  
Surface Roughness ◽  
Electron Transport ◽  
Silicon Nanowires ◽  
Growth Orientation

The effect of surface roughness on lattice thermal conductivity of silicon nanowires

2011 ◽  
Vol 406 (13) ◽  
pp. 2515-2520 ◽  
Author(s):  
Zan Wang ◽  
Zhonghua Ni ◽  
Ruijie Zhao ◽  
Minhua Chen ◽  
Kedong Bi ◽  
...  
Keyword(s):  
Thermal Conductivity ◽  
Surface Roughness ◽  
Silicon Nanowires ◽  
Lattice Thermal Conductivity ◽  
Effect Of Surface

scholarly journals Investigation of the Effects of Various Organic Solvents on the PCBM Electron Transport Layer of Perovskite Solar Cells

Coatings ◽  
2020 ◽  
Vol 10 (3) ◽  
pp. 237
Author(s):  
Chih-Hung Tsai ◽  
Chia-Ming Lin ◽  
Cheng-Hao Kuei
Keyword(s):  
Surface Roughness ◽  
Solar Cells ◽  
Electron Transport ◽  
Organic Solvents ◽  
Electrochemical Impedance ◽  
Perovskite Solar Cells ◽  
Acid Methyl Ester ◽  
Transport Layer ◽  
Electron Transport Layer ◽  
X Ray

In this study, four organic solvents including 1,2-dichlorobenzene (DCB), chlorobenzene (CB), methylbenzene (MB), and chloroform (CF) were used as solvents in the [6,6]-phenyl-C61-butyric acid methyl ester (PCBM) electron transport layer (ETL) of perovskite solar cells (PSCs). This study observed the effects of various solvents on the surface morphology of the ETL by using an optical microscope (OM) and scanning electron microscope (SEM). The surface roughness, crystal structure, and surface element bonding of the ETL were observed using an atomic force microscope (AFM), X-ray diffractometer (XRD), and X-ray photoelectron spectroscope (XPS), respectively. The absorption spectrum of the perovskite layer was explored using an ultraviolet-visible (UV-Vis) spectrometer. The characteristics of the PSC device were analyzed in terms of its current density–voltage (J–V) curve, external quantum efficiency (EQE), and electrochemical impedance spectroscopy (EIS) measurements. The results showed that DCB is a solvent with a high boiling point, low vapor pressure, and high dielectric constant, and using DCB as the solvent for ETL, the uniformity, coverage, and surface roughness of the ETL showed better properties. The power conversion efficiency of the PSC in which DCB was used as the solvent achieved a value of 11.07%, which was higher than that of the PSCs in which other solvents were used.

Effect of surface roughness on elastic limit of silicon nanowires

2015 ◽  
Vol 101 ◽  
pp. 267-274 ◽  
Author(s):  
Qunfeng Liu ◽  
Liang Wang ◽  
Shengping Shen
Keyword(s):  
Surface Roughness ◽  
Silicon Nanowires ◽  
Elastic Limit ◽  
Effect Of Surface

Surface roughness scattering model for arbitrarily oriented silicon nanowires

2011 ◽  
Vol 110 (8) ◽  
pp. 084514 ◽  
Author(s):  
Isabel M. Tienda-Luna ◽  
F. G. Ruiz ◽  
A. Godoy ◽  
B. Biel ◽  
F. Gámiz
Keyword(s):  
Surface Roughness ◽  
Silicon Nanowires ◽  
Scattering Model ◽  
Surface Roughness Scattering

Electron mobility in silicon nanowires using nonlinear surface roughness scattering model

2020 ◽  
Vol 59 (3) ◽  
pp. 034002 ◽  
Author(s):  
Jiahui Duan ◽  
Jinjuan Xiang ◽  
Lixing Zhou ◽  
Xiaolei Wang ◽  
Xueli Ma ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Silicon Nanowires ◽  
Electron Mobility ◽  
Scattering Model ◽  
Surface Roughness Scattering ◽  
Nonlinear Surface
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