scholarly journals Theory of resonant inelastic x-ray scattering at theKedge inLa2CuO4: Multiple scattering effects

2006 ◽  
Vol 74 (24) ◽  
Author(s):  
Jun-ichi Igarashi ◽  
Takuji Nomura ◽  
Manabu Takahashi
Keyword(s):  
Multiple Scattering ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Effects ◽  
Multiple Scattering Effects ◽  
Ray Scattering

scholarly journals Structural characterization using the multiple scattering effects in grazing-incidence small-angle X-ray scattering

2008 ◽  
Vol 41 (1) ◽  
pp. 134-142 ◽  
Author(s):  
Byeongdu Lee ◽  
Chieh-Tsung Lo ◽  
P. Thiyagarajan ◽  
Dong R. Lee ◽  
Zhongwei Niu ◽  
...  
Keyword(s):  
Multiple Scattering ◽  
Small Angle ◽  
Incident Angle ◽  
Average Distance ◽  
Grazing Incidence ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Effects ◽  
Multiple Scattering Effects ◽  
Ray Scattering

The multiple scattering effects present in grazing-incidence small-angle X-ray scattering (GISAXS) data and interference between them are addressed theoretically as well as experimentally with measurement of a series of patterns at different incident angles, referred to as `incident-angle-resolved GISAXS' (IAR-GISAXS). X-ray reflectivity (XR), GISAXS and IAR-GISAXS of virus particles on Si-substrate supported-polystyrene films have been measured and all the data have been analyzed with appropriate formalisms. It was found that under certain conditions it is possible to extract the correct structural features of the materials from the GISAXS/IAR-GISAXS data using the kinematic SAXS formalisms, without the need to use the distorted-wave Born approximation. Furthermore, the Kiessig fringes in GISAXS enable the measurement of the average distance between the particle and the substrate, similar to the measurement of film thickness using the fringes in the XR data. It is believed that the methods developed here will expand the application of GISAXS as they enable the application of model-independent and kinematic SAXS theories to nanostructured two-dimensional ordered films.

X-ray Diffraction from Surfaces and Interfaces:Atomic Structure and Morphology

1990 ◽  
Vol 208 ◽  
Author(s):  
E. Vlieg ◽  
I. K. Robinsson ◽  
J. F Van Der Veen
Keyword(s):  
Surface Science ◽  
X Ray Diffraction ◽  
X Ray ◽  
Structure And Morphology ◽  
X Ray Scattering ◽  
Scattering Effects ◽  
Radiation Sources ◽  
Surface Disorder ◽  
Multiple Scattering Effects ◽  
Ray Scattering

ABSTRACTThe emergence of synchrotron radiation sources has greatly stimulated the use of X-ray scattering in surface science. The absence of multiple-scattering effects allows a straightforward data analysis. In addition to determining geometric structures, it is also possible with X-ray scattering to obtain information on various types of surface disorder. The large penetration depth enables the investigation of interfaces.

X-Ray Diffraction From Surfaces and Interfaces: Atomic Structure and Morphology

1990 ◽  
Vol 202 ◽  
Author(s):  
E. Vlieg ◽  
I.K. Robinson ◽  
J.F. van der Veen
Keyword(s):  
Surface Science ◽  
X Ray Diffraction ◽  
X Ray ◽  
Surfaces And Interfaces ◽  
X Ray Scattering ◽  
Scattering Effects ◽  
Radiation Sources ◽  
Surface Disorder ◽  
Multiple Scattering Effects ◽  
Ray Scattering

ABSTRACTThe emergence of synchrotron radiation sources has greatly stimulated the use of X-ray scattering in surface science. The absence of multiple-scattering effects allows a straightforward data analysis. In addition to determining geometric structures, it is also possible with X-ray scattering to obtain information on various types of surface disorder. The large penetration depth enables the investigation of interfaces.

X-ray scattering effects of ionic size in solid solutions KCl–KBr

1970 ◽  
Vol 3 (5) ◽  
pp. 385-388 ◽  
Author(s):  
P. Luova ◽  
P. Tuominen ◽  
P. Vanha-Kämppä
Keyword(s):  
Solid Solutions ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Effects ◽  
Ionic Size ◽  
Ray Scattering

Multiple-scattering effects in theK-edge x-ray-absorption near-edge structure of crystalline and amorphous silicon

1987 ◽  
Vol 36 (12) ◽  
pp. 6426-6433 ◽  
Author(s):  
A. Bianconi ◽  
A. Di Cicco ◽  
N. V. Pavel ◽  
M. Benfatto ◽  
A. Marcelli ◽  
...  
Keyword(s):  
Amorphous Silicon ◽  
Multiple Scattering ◽  
Edge Structure ◽  
X Ray ◽  
Scattering Effects ◽  
X Ray Absorption ◽  
Multiple Scattering Effects

X-Ray Scattering Effects Due to Localized Static Lattice Defects

1955 ◽  
Vol 99 (6) ◽  
pp. 1777-1781 ◽  
Author(s):  
Charles W. Tucker ◽  
Peter Senio
Keyword(s):  
Lattice Defects ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Effects ◽  
Static Lattice ◽  
Ray Scattering
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