Near-edge structure of nonresonant inelastic x-ray scattering fromL-shell core levels studied by a real-space multiple-scattering approach

2007 ◽  
Vol 75 (7) ◽  
Author(s):  
H. Sternemann ◽  
J. A. Soininen ◽  
C. Sternemann ◽  
K. Hämäläinen ◽  
M. Tolan
Author(s):  
Jonathan Almer

Acquisition of microstructural information during realistic service conditions is an ongoing need for fundamental materials insight and computational input. In addition, for engineering applications it is often important to be able to study materials over a wide range of penetration depths, from the surface to bulk. In this presentation we discuss developments at the Sector 1-ID beamline of the Advanced Photon Source (APS) to utilize high-energy x-ray scattering for such studies. The use of high-energies (~80 keV) provides a highly penetrating probe, with sampling depths up to several mm in most materials. Through the development and use of high-energy optics, we can perform both small- and wide-angle scattering (SAXS/WAXS), to probe a large range of sample dimensions in reciprocal space (ranging from Angstroms to hundreds of nanometers), with real space resolutions ranging from microns to mm.


1998 ◽  
Vol 58 (12) ◽  
pp. 7565-7576 ◽  
Author(s):  
A. L. Ankudinov ◽  
B. Ravel ◽  
J. J. Rehr ◽  
S. D. Conradson

2008 ◽  
Vol 41 (1) ◽  
pp. 134-142 ◽  
Author(s):  
Byeongdu Lee ◽  
Chieh-Tsung Lo ◽  
P. Thiyagarajan ◽  
Dong R. Lee ◽  
Zhongwei Niu ◽  
...  

The multiple scattering effects present in grazing-incidence small-angle X-ray scattering (GISAXS) data and interference between them are addressed theoretically as well as experimentally with measurement of a series of patterns at different incident angles, referred to as `incident-angle-resolved GISAXS' (IAR-GISAXS). X-ray reflectivity (XR), GISAXS and IAR-GISAXS of virus particles on Si-substrate supported-polystyrene films have been measured and all the data have been analyzed with appropriate formalisms. It was found that under certain conditions it is possible to extract the correct structural features of the materials from the GISAXS/IAR-GISAXS data using the kinematic SAXS formalisms, without the need to use the distorted-wave Born approximation. Furthermore, the Kiessig fringes in GISAXS enable the measurement of the average distance between the particle and the substrate, similar to the measurement of film thickness using the fringes in the XR data. It is believed that the methods developed here will expand the application of GISAXS as they enable the application of model-independent and kinematic SAXS theories to nanostructured two-dimensional ordered films.


2000 ◽  
Vol 69 (6) ◽  
pp. 1614-1617 ◽  
Author(s):  
Manabu Takahashi ◽  
Jun-ichi Igarashi ◽  
Peter Fulde

2003 ◽  
Vol 36 (3) ◽  
pp. 405-409 ◽  
Author(s):  
L.A Chiavacci ◽  
K Dahmouche ◽  
C.V Santilli ◽  
V de Zea Bermudez ◽  
L.D Carlos ◽  
...  

2018 ◽  
Vol 98 (2) ◽  
Author(s):  
Yuya Shinohara ◽  
Wojciech Dmowski ◽  
Takuya Iwashita ◽  
Bin Wu ◽  
Daisuke Ishikawa ◽  
...  

2019 ◽  
Vol 100 (3) ◽  
Author(s):  
Yuya Shinohara ◽  
Wojciech Dmowski ◽  
Takuya Iwashita ◽  
Bin Wu ◽  
Daisuke Ishikawa ◽  
...  

2013 ◽  
Vol 46 (1) ◽  
pp. 165-172 ◽  
Author(s):  
Xinhui Lu ◽  
Kevin G. Yager ◽  
Danvers Johnston ◽  
Charles T. Black ◽  
Benjamin M. Ocko

Determination of the three-dimensional order in thin nanostructured films remains challenging. Real-space imaging methods, including electron microscopies and scanning-probe methods, have difficulty reconstructing the depth of a film and suffer from limited statistical sampling. X-ray and neutron scattering have emerged as powerful complementary techniques but have substantial data collection and analysis challenges. This article describes a new method, grazing-incidence transmission small-angle X-ray scattering, which allows for fast scattering measurements that are not burdened by the refraction and reflection effects that have to date plagued grazing-incidence X-ray scattering. In particular, by arranging a sample/beam geometry wherein the scattering exits through the edge of the substrate, it is possible to record scattering images that are well described by straightforward (Born approximation) scattering models.


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