X-Ray Diffraction From Surfaces and Interfaces: Atomic Structure and Morphology

1990 ◽  
Vol 202 ◽  
Author(s):  
E. Vlieg ◽  
I.K. Robinson ◽  
J.F. van der Veen
Keyword(s):  
Surface Science ◽  
X Ray Diffraction ◽  
X Ray ◽  
Surfaces And Interfaces ◽  
X Ray Scattering ◽  
Scattering Effects ◽  
Radiation Sources ◽  
Surface Disorder ◽  
Multiple Scattering Effects ◽  
Ray Scattering

ABSTRACTThe emergence of synchrotron radiation sources has greatly stimulated the use of X-ray scattering in surface science. The absence of multiple-scattering effects allows a straightforward data analysis. In addition to determining geometric structures, it is also possible with X-ray scattering to obtain information on various types of surface disorder. The large penetration depth enables the investigation of interfaces.

X-ray Diffraction from Surfaces and Interfaces:Atomic Structure and Morphology

1990 ◽  
Vol 208 ◽  
Author(s):  
E. Vlieg ◽  
I. K. Robinsson ◽  
J. F Van Der Veen
Keyword(s):  
Surface Science ◽  
X Ray Diffraction ◽  
X Ray ◽  
Structure And Morphology ◽  
X Ray Scattering ◽  
Scattering Effects ◽  
Radiation Sources ◽  
Surface Disorder ◽  
Multiple Scattering Effects ◽  
Ray Scattering

ABSTRACTThe emergence of synchrotron radiation sources has greatly stimulated the use of X-ray scattering in surface science. The absence of multiple-scattering effects allows a straightforward data analysis. In addition to determining geometric structures, it is also possible with X-ray scattering to obtain information on various types of surface disorder. The large penetration depth enables the investigation of interfaces.

scholarly journals Structural characterization using the multiple scattering effects in grazing-incidence small-angle X-ray scattering

2008 ◽  
Vol 41 (1) ◽  
pp. 134-142 ◽  
Author(s):  
Byeongdu Lee ◽  
Chieh-Tsung Lo ◽  
P. Thiyagarajan ◽  
Dong R. Lee ◽  
Zhongwei Niu ◽  
...  
Keyword(s):  
Multiple Scattering ◽  
Small Angle ◽  
Incident Angle ◽  
Average Distance ◽  
Grazing Incidence ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Effects ◽  
Multiple Scattering Effects ◽  
Ray Scattering

The multiple scattering effects present in grazing-incidence small-angle X-ray scattering (GISAXS) data and interference between them are addressed theoretically as well as experimentally with measurement of a series of patterns at different incident angles, referred to as `incident-angle-resolved GISAXS' (IAR-GISAXS). X-ray reflectivity (XR), GISAXS and IAR-GISAXS of virus particles on Si-substrate supported-polystyrene films have been measured and all the data have been analyzed with appropriate formalisms. It was found that under certain conditions it is possible to extract the correct structural features of the materials from the GISAXS/IAR-GISAXS data using the kinematic SAXS formalisms, without the need to use the distorted-wave Born approximation. Furthermore, the Kiessig fringes in GISAXS enable the measurement of the average distance between the particle and the substrate, similar to the measurement of film thickness using the fringes in the XR data. It is believed that the methods developed here will expand the application of GISAXS as they enable the application of model-independent and kinematic SAXS theories to nanostructured two-dimensional ordered films.

Time-resolved isothermal crystallization of absorbable PGA-co-PLA copolymer by synchrotron small-angle X-ray scattering and wide-angle X-ray diffraction

Polymer ◽  
2001 ◽  
Vol 42 (21) ◽  
pp. 8965-8973 ◽  
Author(s):  
Zhi-Gang Wang ◽  
Xuehui Wang ◽  
Benjamin S. Hsiao ◽  
Saša Andjelić ◽  
Dennis Jamiolkowski ◽  
...  
Keyword(s):  
Small Angle ◽  
Isothermal Crystallization ◽  
Wide Angle ◽  
X Ray Diffraction ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

X-ray scattering effects of ionic size in solid solutions KCl–KBr

1970 ◽  
Vol 3 (5) ◽  
pp. 385-388 ◽  
Author(s):  
P. Luova ◽  
P. Tuominen ◽  
P. Vanha-Kämppä
Keyword(s):  
Solid Solutions ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Effects ◽  
Ionic Size ◽  
Ray Scattering

A high-throughput assembly of beam-shaping channel-cut monochromators for laboratory high-resolution X-ray diffraction and small-angle X-ray scattering experiments

2021 ◽  
Vol 54 (3) ◽  
Author(s):  
Peter Nadazdy ◽  
Jakub Hagara ◽  
Petr Mikulik ◽  
Zdenko Zaprazny ◽  
Dusan Korytar ◽  
...  
Keyword(s):  
High Resolution ◽  
Small Angle ◽  
Photon Flux ◽  
Photon Flux Density ◽  
X Ray Diffraction ◽  
High Beam ◽  
X Ray ◽  
X Ray Scattering ◽  
Beam Collimation ◽  
Ray Scattering

A four-bounce monochromator assembly composed of Ge(111) and Ge(220) monolithic channel-cut monochromators with V-shaped channels in a quasi-dispersive configuration is presented. The assembly provides an optimal design in terms of the highest transmittance and photon flux density per detector pixel while maintaining high beam collimation. A monochromator assembly optimized for the highest recorded intensity per detector pixel of a linear detector placed 2.5 m behind the assembly was realized and tested by high-resolution X-ray diffraction and small-angle X-ray scattering measurements using a microfocus X-ray source. Conventional symmetric and asymmetric Ge(220) Bartels monochromators were similarly tested and the results were compared. The new assembly provides a transmittance that is an order of magnitude higher and 2.5 times higher than those provided by the symmetric and asymmetric Bartels monochromators, respectively, while the output beam divergence is twice that of the asymmetric Bartels monochromator. These results demonstrate the advantage of the proposed monochromator assembly in cases where the resolution can be partially sacrificed in favour of higher transmittance while still maintaining high beam collimation. Weakly scattering samples such as nanostructures are an example. A general advantage of the new monochromator is a significant reduction in the exposure time required to collect usable experimental data. A comparison of the theoretical and experimental results also reveals the current limitations of the technology of polishing hard-to-reach surfaces in X-ray crystal optics.

Evidence of a single-q incommensurate phase in quartz by synchrotron X-ray diffraction

1988 ◽  
Vol 21 (1) ◽  
pp. 72-74 ◽  
Author(s):  
A. Zarka ◽  
B. Capelle ◽  
M. Petit ◽  
G. Dolino ◽  
P. Bastie ◽  
...  
Keyword(s):  
Neutron Scattering ◽  
Uniaxial Stress ◽  
Incommensurate Phase ◽  
X Ray Diffraction ◽  
X Ray ◽  
X Ray Scattering ◽  
Good Agreement ◽  
Ray Scattering

X-ray scattering is used to demonstrate the existence in quartz of an incommensurate phase with a single modulation when a uniaxial stress is applied in the X Y plane. Good agreement with earlier neutron scattering experiments is found.

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