Native point defects in yttria and relevance to its use as a high-dielectric-constant gate oxide material: First-principles study
2008 ◽
Vol 2
(5)
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pp. 227-229
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2000 ◽
Vol 61
(22)
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pp. 15019-15027
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2015 ◽
Vol 465
◽
pp. 161-166
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2008 ◽
Vol 85
(1)
◽
pp. 9-14
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