Thickness dependence of anomalous magnetic behavior in epitaxial Fe3O4(111) thin films: Effect of density of antiphase boundaries

2004 ◽  
Vol 70 (17) ◽  
Author(s):  
J.-B. Moussy ◽  
S. Gota ◽  
A. Bataille ◽  
M.-J. Guittet ◽  
M. Gautier-Soyer ◽  
...  
2002 ◽  
Vol 747 ◽  
Author(s):  
Naoki Wakiya ◽  
Kazuo Shinozaki ◽  
Nobuyasu Mizutani

ABSTRACTEpitaxial nickel zinc ferrite (Ni,Zn)Fe2O4 (NZF) thin films were successfully deposited on (MgO-Al2O3)/CeO2/YSZ/Si(001) substrates, where (MgO-Al2O3) is MgO doped with Al2O3. The crystallographic orientation and magnetic properties (saturation magnetization: Ms, and squareness: Mr/Ms where Mr is remanent magnetization) of NZF thin films were considerably changed with the amount of Al2O3 addition. If the amount of Al2O3 addition was less than 7 mol%, (001)-oriented epitaxial NZF thin films were obtained and the films had low squareness (around 45%). If the amount of Al2O3 addition was more than 7 mol%, (111)-oriented epitaxial NZF thin films were obtained and the films had high squareness (around 60–81%). Maximum squareness (81%) was obtained if the amount of Al2O3 addition was 26 mol%. For the sample with this Al2O3 content, the lattice mismatch between NZF and (MgO-Al2O3) buffer layer was 3.2%. The fact that high squareness was not obtained if lattice mismatch was very small (-0.3% on MgO) but obtained if lattice mismatch was 3.2% suggests that lattice mismatch to a certain content is important to avoid the formation of antiphase boundaries (APBs). This consideration was confirmed by examining other buffer layers having various lattice mismatches with NZF.


2008 ◽  
Vol 92 (11) ◽  
pp. 112501 ◽  
Author(s):  
Yuan-Hua Lin ◽  
Songyin Zhang ◽  
Chaoyong Deng ◽  
Yi Zhang ◽  
Xiaohui Wang ◽  
...  

1989 ◽  
Vol 50 (C6) ◽  
pp. C6-177-C6-177
Author(s):  
J. YUAN ◽  
S. BERGER ◽  
L. M. BROWN

2011 ◽  
Vol 406 (23) ◽  
pp. 4436-4439 ◽  
Author(s):  
G. Bai ◽  
R. Li ◽  
H.N. Xu ◽  
Y.D. Xia ◽  
Z.G. Liu ◽  
...  

2020 ◽  
Author(s):  
A. Amali Roselin ◽  
N. Anandhan ◽  
I. Joseph Paneer Doss ◽  
G. Gopu ◽  
K. P. Ganesan ◽  
...  

2015 ◽  
Vol 57 (8) ◽  
pp. 1529-1534 ◽  
Author(s):  
V. B. Shirokov ◽  
Yu. I. Golovko ◽  
V. M. Mukhortov ◽  
Yu. I. Yuzyuk ◽  
P. E. Janolin ◽  
...  

2001 ◽  
Vol 665 ◽  
Author(s):  
Feng Xia ◽  
H.S. Xu ◽  
Babak Razavi ◽  
Q. M. Zhang

ABSTRACTFerroelectric polymer thin films are attractive for a wide range of applications such as MEMS, IR sensors, and memory devices. We present the results of a recent investigation on the thickness dependence of the ferroelectric properties of poly(vinylidene fluoridetrifluoroethylene) copolymer spin cast films on electroded Si substrate. We show that as the film thickness is reduced, there exist two thickness regions. For films at thickness above 100 nm, the thickness dependence of the ferroelectric properties can be attributed to the interface effect. However, for thinner films, there is a large change in the ferroelectric properties such as the polarization level, the coercive field, and polarization switching speed, which is related to the large drop of the crystallinity in the ultrathin film region (below 100 nm). The results from Xray, dielectric measurement, and AFM all indicate that there is a threshold thickness at about 100 nm below which the crystallinity in the film reduces abruptly.


2013 ◽  
Vol 23 (3) ◽  
pp. 7500604-7500604 ◽  
Author(s):  
D. B. Beringer ◽  
C. Clavero ◽  
T. Tan ◽  
X. X. Xi ◽  
W. M. Roach ◽  
...  

2003 ◽  
Vol 93 (10) ◽  
pp. 7945-7947 ◽  
Author(s):  
S. Kämmerer ◽  
S. Heitmann ◽  
D. Meyners ◽  
D. Sudfeld ◽  
A. Thomas ◽  
...  

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