Determination of shear stiffness based on thermal noise analysis in atomic force microscopy: Passive overtone microscopy

Tanja Drobek; Robert W. Stark; Wolfgang M. Heckl

doi:10.1103/physrevb.64.045401

Determination of shear stiffness based on thermal noise analysis in atomic force microscopy: Passive overtone microscopy

Physical Review B ◽

10.1103/physrevb.64.045401 ◽

2001 ◽

Vol 64 (4) ◽

Cited By ~ 47

Author(s):

Tanja Drobek ◽

Robert W. Stark ◽

Wolfgang M. Heckl

Keyword(s):

Atomic Force Microscopy ◽

Thermal Noise ◽

Noise Analysis ◽

Shear Stiffness ◽

Force Microscopy ◽

Atomic Force

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Thermal noise in contact atomic force microscopy

Journal of Applied Physics ◽

10.1063/5.0054256 ◽

2021 ◽

Vol 129 (23) ◽

pp. 234303

Author(s):

Chengfu Ma ◽

Chenggang Zhou ◽

Jinlan Peng ◽

Yuhang Chen ◽

Walter Arnold ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Thermal Noise ◽

Force Microscopy ◽

Atomic Force

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Determination of near-surface forces in optical polishing using atomic force microscopy

Nanotechnology ◽

10.1088/0957-4484/5/2/002 ◽

1994 ◽

Vol 5 (2) ◽

pp. 70-79 ◽

Cited By ~ 7

Author(s):

M J Cumbo ◽

S D Jacobs

Keyword(s):

Atomic Force Microscopy ◽

Surface Forces ◽

Near Surface ◽

Force Microscopy ◽

Atomic Force ◽

Optical Polishing

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Experimental determination of the mechanical impedance of atomic force microscopy cantilevers in fluids up to 70 kHz

Journal of Applied Physics ◽

10.1063/1.1287522 ◽

2000 ◽

Vol 88 (5) ◽

pp. 2912-2920 ◽

Cited By ~ 22

Author(s):

Marc P. Scherer ◽

Gerhard Frank ◽

Anthony W. Gummer

Keyword(s):

Atomic Force Microscopy ◽

Experimental Determination ◽

Mechanical Impedance ◽

Force Microscopy ◽

Atomic Force

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Determination of spatial resolution in atomic-force-microscopy-based electrical characterization techniques using quantum well structures

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.1835317 ◽

2005 ◽

Vol 23 (1) ◽

pp. 61 ◽

Cited By ~ 10

Author(s):

O. Douhéret ◽

S. Bonsels ◽

S. Anand

Keyword(s):

Atomic Force Microscopy ◽

Quantum Well ◽

Spatial Resolution ◽

Electrical Characterization ◽

Quantum Well Structures ◽

Force Microscopy ◽

Characterization Techniques ◽

Atomic Force

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Determination of electrostatic force and its characteristics based on phase difference by amplitude modulation atomic force microscopy

Nanoscale Research Letters ◽

10.1186/s11671-016-1765-2 ◽

2016 ◽

Vol 11 (1) ◽

Cited By ~ 2

Author(s):

Kesheng Wang ◽

Jia Cheng ◽

Shiji Yao ◽

Yijia Lu ◽

Linhong Ji ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Phase Difference ◽

Amplitude Modulation ◽

Electrostatic Force ◽

Force Microscopy ◽

Atomic Force

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Determination of the surface area of annealed continuous gold film and pyrex glass in situ by the BET adsorption isotherm and ex situ by Atomic Force Microscopy in air

Applied Surface Science ◽

10.1016/s0169-4332(98)00297-9 ◽

1998 ◽

Vol 135 (1-4) ◽

pp. 8-14 ◽

Cited By ~ 5

Author(s):

L Stobiński ◽

L Zommer

Keyword(s):

Atomic Force Microscopy ◽

Adsorption Isotherm ◽

Surface Area ◽

Gold Film ◽

Ex Situ ◽

Pyrex Glass ◽

Force Microscopy ◽

Atomic Force

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Determination of solid surface tension at the nano-scale using atomic force microscopy

Contact Angle, Wettability and Adhesion, Volume 4 ◽

10.1201/b12166-17 ◽

2006 ◽

pp. 249-276

Keyword(s):

Surface Tension ◽

Atomic Force Microscopy ◽

Solid Surface ◽

Force Microscopy ◽

Nano Scale ◽

Atomic Force ◽

Solid Surface Tension

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Determination of Microdomain Size in Langmuir-Blodgett Films of Binary Mixtures by IR Spectroscopy and Atomic Force Microscopy

Progress in Fourier Transform Spectroscopy ◽

10.1007/978-3-7091-6840-0_177 ◽

1997 ◽

pp. 683-685

Author(s):

Suci Widayati ◽

Richard A. Dluhy

Keyword(s):

Atomic Force Microscopy ◽

Ir Spectroscopy ◽

Binary Mixtures ◽

Force Microscopy ◽

Langmuir Blodgett ◽

Atomic Force ◽

Langmuir Blodgett Films

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Determination of Punica granatum L. Carpellary membrane elastic properties using atomic force microscopy

Recent Advances in Multidisciplinary Applied Physics ◽

10.1016/b978-008044648-6/50020-3 ◽

2005 ◽

pp. 119-125

Author(s):

M MILLAN ◽

M GASQUE ◽

F GARCIADIEGO ◽

J CURIEL ◽

G RUIZ

Keyword(s):

Atomic Force Microscopy ◽

Elastic Properties ◽

Punica Granatum ◽

Force Microscopy ◽

Atomic Force ◽

Punica Granatum L

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Determination of the morphology of conducting polymers with scanning tunneling microscopy and atomic force microscopy

Synthetic Metals ◽

10.1016/0379-6779(91)91002-r ◽

1991 ◽

Vol 41 (1-2) ◽

pp. 77 ◽

Cited By ~ 1

Keyword(s):

Atomic Force Microscopy ◽

Conducting Polymers ◽

Scanning Tunneling Microscopy ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Force Microscopy ◽

Atomic Force

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