Dynamic force microscopy of copper surfaces: Atomic resolution and distance dependence of tip-sample interaction and tunneling current

2000 ◽  
Vol 62 (24) ◽  
pp. 16944-16949 ◽  
Author(s):  
Ch. Loppacher ◽  
M. Bammerlin ◽  
M. Guggisberg ◽  
S. Schär ◽  
R. Bennewitz ◽  
...  
Keyword(s):  
Tunneling Current ◽  
Atomic Resolution ◽  
Dynamic Force ◽  
Copper Surfaces ◽  
Force Microscopy ◽  
Distance Dependence

Atomic Force Microscopy

2021 ◽  
pp. 379-400
Author(s):  
C. Julian Chen
Keyword(s):  
Atomic Force Microscopy ◽  
Entire Range ◽  
Tunneling Current ◽  
Vibrational Amplitude ◽  
Dynamic Mode ◽  
Dynamic Force ◽  
Force Detection ◽  
Static Mode ◽  
Force Microscopy ◽  
Atomic Force

This chapter discusses atomic force microscopy (AFM), focusing on the methods for atomic force detection. Although the force detection always requires a cantilever, there are two types of modes: the static mode and the dynamic mode. The general design and the typical method of manufacturing of the cantilevers are discussed. Two popular methods of static force detection are presented. The popular dynamic-force detection method, the tapping mode is described, especially the methods in liquids. The non-contact AFM, which has achieved atomic resolution in the weak attractive force regime, is discussed in detail. An elementary and transparent analysis of the principles, including the frequency shift, the second harmonics, and the average tunneling current, is presented. It requires only Newton’s equation and Fourier analysis, and the final results are analyzed over the entire range of vibrational amplitude. The implementation is briefly discussed.

Atomic resolution in dynamic force microscopy across steps on Si(1 1 1)7×7

1996 ◽  
Vol 100 (2) ◽  
pp. 165-167 ◽  
Author(s):  
R. Lüthi ◽  
E. Meyer ◽  
M. Bammerlin ◽  
A. Baratoff ◽  
T. Lehmann ◽  
...  
Keyword(s):  
Atomic Resolution ◽  
Dynamic Force ◽  
Force Microscopy

Atomic resolution on a metal single crystal with dynamic force microscopy

2009 ◽  
Vol 95 (8) ◽  
pp. 083116 ◽  
Author(s):  
T. König ◽  
G. H. Simon ◽  
H.-P. Rust ◽  
M. Heyde
Keyword(s):  
Single Crystal ◽  
Atomic Resolution ◽  
Dynamic Force ◽  
Force Microscopy ◽  
Metal Single Crystal

ULTRAHIGH VACUUM ATOMIC FORCE MICROSCOPY: TRUE ATOMIC RESOLUTION

1997 ◽  
Vol 04 (05) ◽  
pp. 1025-1029 ◽  
Author(s):  
R. LÜTHI ◽  
E. MEYER ◽  
M. BAMMERLIN ◽  
A. BARATOFF ◽  
L. HOWALD ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Ultrahigh Vacuum ◽  
Tunneling Current ◽  
Atomic Resolution ◽  
Restricted Range ◽  
Dissipation Energy ◽  
Force Microscopy ◽  
Atomic Force ◽  
The Mean ◽  
Reconstructed Surface

In this note we report the first observation of salient features of the Si(111)(7×7) reconstructed surface across monatomic steps by dynamic atomic force microscopy (AFM) in ultrahigh vacuum (UHV). Simultaneous measurements of the resonance frequency shift Δf of the Si cantilever and of the mean tunneling current [Formula: see text] from the cleaned Si tip indicate a restricted range for stable imaging with true atomic resolution. The corresponding characteristics vs. distance reveal why feedback control via Δf is problematic, whereas it is as successful as in conventional STM via [Formula: see text]. Furthermore, local dissipation (energy loss of 10-14 W) through individual atoms is observed and explained by the coupling of the surface atoms to phonons.

Dynamic force microscopy with atomic resolution at low temperatures

2002 ◽  
Vol 188 (3-4) ◽  
pp. 245-251 ◽  
Author(s):  
Alexander Schwarz ◽  
Udo D. Schwarz ◽  
Shenja Langkat ◽  
Hendrik Hölscher ◽  
Wolf Allers ◽  
...  
Keyword(s):  
Low Temperatures ◽  
Atomic Resolution ◽  
Dynamic Force ◽  
Force Microscopy
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