Atomic resolution in dynamic force microscopy across steps on Si(1 1 1)7×7

1996 ◽  
Vol 100 (2) ◽  
pp. 165-167 ◽  
Author(s):  
R. Lüthi ◽  
E. Meyer ◽  
M. Bammerlin ◽  
A. Baratoff ◽  
T. Lehmann ◽  
...  
Keyword(s):  
Atomic Resolution ◽  
Dynamic Force ◽  
Force Microscopy

Dynamic force microscopy of copper surfaces: Atomic resolution and distance dependence of tip-sample interaction and tunneling current

2000 ◽  
Vol 62 (24) ◽  
pp. 16944-16949 ◽  
Author(s):  
Ch. Loppacher ◽  
M. Bammerlin ◽  
M. Guggisberg ◽  
S. Schär ◽  
R. Bennewitz ◽  
...  
Keyword(s):  
Tunneling Current ◽  
Atomic Resolution ◽  
Dynamic Force ◽  
Copper Surfaces ◽  
Force Microscopy ◽  
Distance Dependence

Atomic resolution on a metal single crystal with dynamic force microscopy

2009 ◽  
Vol 95 (8) ◽  
pp. 083116 ◽  
Author(s):  
T. König ◽  
G. H. Simon ◽  
H.-P. Rust ◽  
M. Heyde
Keyword(s):  
Single Crystal ◽  
Atomic Resolution ◽  
Dynamic Force ◽  
Force Microscopy ◽  
Metal Single Crystal

Dynamic force microscopy with atomic resolution at low temperatures

2002 ◽  
Vol 188 (3-4) ◽  
pp. 245-251 ◽  
Author(s):  
Alexander Schwarz ◽  
Udo D. Schwarz ◽  
Shenja Langkat ◽  
Hendrik Hölscher ◽  
Wolf Allers ◽  
...  
Keyword(s):  
Low Temperatures ◽  
Atomic Resolution ◽  
Dynamic Force ◽  
Force Microscopy

Atomic Resolution Imaging on Si(100)2×1 and Si(100)2×1:H Surfaces with Noncontact Atomic Force Microscopy

2000 ◽  
Vol 39 (Part 2, No. 2A) ◽  
pp. L113-L115 ◽  
Author(s):  
Kousuke Yokoyama ◽  
Taketoshi Ochi ◽  
Akira Yoshimoto ◽  
Yasuhiro Sugawara ◽  
Seizo Morita
Keyword(s):  
Atomic Force Microscopy ◽  
Atomic Resolution ◽  
Force Microscopy ◽  
Atomic Force ◽  
Resolution Imaging

Higher Harmonics and Time-Varying Forces in Dynamic Force Microscopy

2010 ◽  
pp. 711-729 ◽  
Author(s):  
Ozgur Sahin ◽  
Calvin F. Quate ◽  
Olav Solgaard ◽  
Franz J. Giessibl
Keyword(s):  
Dynamic Force ◽  
Time Varying ◽  
Higher Harmonics ◽  
Force Microscopy
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