scholarly journals Angle dependence of Andreev scattering at semiconductor–superconductor interfaces

1999 ◽  
Vol 59 (15) ◽  
pp. 10176-10182 ◽  
Author(s):  
Niels Asger Mortensen ◽  
Karsten Flensberg ◽  
Antti-Pekka Jauho
Keyword(s):  
Angle Dependence ◽  
Andreev Scattering

Scattering-angle dependence of signal/background ratio of inner-shell electron excitation loss in EELS

1983 ◽  
Vol 41 ◽  
pp. 390-391
Author(s):  
T. Oikawa ◽  
M. Inoue ◽  
T. Honda ◽  
Y. Kokubo
Keyword(s):  
Energy Loss ◽  
Electron Excitation ◽  
Heavy Elements ◽  
Background Intensity ◽  
Light Elements ◽  
Energy Analyzer ◽  
High Background ◽  
Scattering Angle ◽  
Angle Dependence ◽  
Shell Electron

EELS allows us to make analysis of light elements such as hydrogen to heavy elements of microareas on the specimen. In energy loss spectra, however, elemental signals ride on a high background; therefore, the signal/background (S/B) ratio is very low in EELS. A technique which collects the center beam axial-symmetrically in the scattering angle is generally used to obtain high total intensity. However, the technique collects high background intensity together with elemental signals; therefore, the technique does not improve the S/B ratio. This report presents the experimental results of the S/B ratio measured as a function of the scattering angle and shows the possibility of the S/B ratio being improved in the high scattering angle range.Energy loss spectra have been measured using a JEM-200CX TEM with an energy analyzer ASEA3 at 200 kV.Fig.l shows a typical K-shell electron excitation edge riding on background in an energy loss spectrum.

The sidewall angle dependence of CDSEM measurements and its impact on CD process control

2005 ◽  
Author(s):  
Justin J. Hwu ◽  
Homayoun Kiamanesh ◽  
Sukhbir Dulay ◽  
Peter Wilkens
Keyword(s):  
Process Control ◽  
Angle Dependence ◽  
Sidewall Angle

The angle dependence of the upper critical field of HoNi2B2C thin films

2000 ◽  
Vol 341-348 ◽  
pp. 761-762 ◽  
Author(s):  
K. Haese ◽  
B. Holzapfel ◽  
L. Schultz
Keyword(s):  
Thin Films ◽  
Critical Field ◽  
Upper Critical Field ◽  
Angle Dependence
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