Theoretical study of luminescence enhancement in oxidized Si(001) ultrathin films

1998 ◽  
Vol 58 (11) ◽  
pp. 7103-7112 ◽  
Author(s):  
Masahiko Nishida
2013 ◽  
Vol 11 (9) ◽  
pp. 1658-1666 ◽  
Author(s):  
M. Boukelkoul ◽  
N. Ouarab ◽  
M. Kharoubi ◽  
A. Haroun

2014 ◽  
Vol 16 (34) ◽  
pp. 18098-18104 ◽  
Author(s):  
Nabraj Bhattarai ◽  
Subarna Khanal ◽  
Daniel Bahena ◽  
Jimena A. Olmos-Asar ◽  
Arturo Ponce ◽  
...  

The structural order in ultrathin films of monolayer protected clusters (MPCs) is important in a number of application areas but can be difficult to demonstrate by conventional methods, particularly when the metallic core dimension, d, is in the intermediate size-range, 1.5 < d < 5.0 nm.


Author(s):  
Yoshichika Bando ◽  
Takahito Terashima ◽  
Kenji Iijima ◽  
Kazunuki Yamamoto ◽  
Kazuto Hirata ◽  
...  

The high quality thin films of high-Tc superconducting oxide are necessary for elucidating the superconducting mechanism and for device application. The recent trend in the preparation of high-Tc films has been toward “in-situ” growth of the superconducting phase at relatively low temperatures. The purpose of “in-situ” growth is to attain surface smoothness suitable for fabricating film devices but also to obtain high quality film. We present the investigation on the initial growth manner of YBCO by in-situ reflective high energy electron diffraction (RHEED) technique and on the structural and superconducting properties of the resulting ultrathin films below 100Å. The epitaxial films have been grown on (100) plane of MgO and SrTiO, heated below 650°C by activated reactive evaporation. The in-situ RHEED observation and the intensity measurement was carried out during deposition of YBCO on the substrate at 650°C. The deposition rate was 0.8Å/s. Fig. 1 shows the RHEED patterns at every stage of deposition of YBCO on MgO(100). All the patterns exhibit the sharp streaks, indicating that the film surface is atomically smooth and the growth manner is layer-by-layer.


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