Theory of single-electron tunneling in resonant-tunneling diodes including scattering and multiple subbands at finite temperature

1996 ◽  
Vol 53 (11) ◽  
pp. 7392-7402 ◽  
Author(s):  
K. M. Indlekofer ◽  
J. Lange ◽  
A. Förster ◽  
H. Lüth
1992 ◽  
Vol 45 (24) ◽  
pp. 14407-14410 ◽  
Author(s):  
M. Tewordt ◽  
L. Marti´n-Moreno ◽  
J. T. Nicholls ◽  
M. Pepper ◽  
M. J. Kelly ◽  
...  

1998 ◽  
Vol 84 (12) ◽  
pp. 6718-6724 ◽  
Author(s):  
M. Griebel ◽  
K. M. Indlekofer ◽  
A. Förster ◽  
H. Lüth

1998 ◽  
Vol 168 (2) ◽  
pp. 219
Author(s):  
V.A. Krupenin ◽  
S.V. Lotkhov ◽  
H. Scherer ◽  
A.B. Zorin ◽  
F.-J. Ahlers ◽  
...  

2000 ◽  
Vol 631 ◽  
Author(s):  
J. G. Fleming ◽  
E. Chow ◽  
S.-Y. Lin

ABSTRACTResonance Tunneling Diodes (RTDs) are devices that can demonstrate very highspeed operation. Typically they have been fabricated using epitaxial techniques and materials not consistent with standard commercial integrated circuits. We report here the first demonstration of SiO2-Si-SiO2 RTDs. These new structures were fabricated using novel combinations of silicon integrated circuit processes.


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