Potential-well-roughness-induced transition from resonant tunneling to single-electron tunneling in Si∕SiO2 double-barrier structure
1992 ◽
Vol 45
(24)
◽
pp. 14407-14410
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Keyword(s):
2003 ◽
Vol 17
(03)
◽
pp. 105-109
◽
1987 ◽
Vol 140
(1)
◽
pp. K23-K25
◽
Keyword(s):
Influence on Characteristics of RTD Due to Variation of Different Parameters and Material Properties
2017 ◽
Vol 26
(04)
◽
pp. 1740022
◽
1992 ◽
Vol 06
(13)
◽
pp. 2321-2343
◽