Hot-electron transport through Au/GaAs and Au/GaAs/AlAs heterojunction interfaces: Ballistic-electron-emission-microscopy measurement and Monte Carlo simulation

1996 ◽  
Vol 53 (8) ◽  
pp. 4845-4849 ◽  
Author(s):  
Mao-long Ke ◽  
D. I. Westwood ◽  
C. C. Matthai ◽  
B. E. Richardson ◽  
R. H. Williams
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Electron Transport ◽  
Electron Emission ◽  
Hot Electron ◽  
Ballistic Electron Emission Microscopy ◽  
Ballistic Electron ◽  
Microscopy Measurement ◽  
Emission Microscopy ◽  
Hot Electron Transport
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