Role of point defects and their clusters for flux pinning as determined from irradiation and annealing experiments inYBa2Cu3O7−δsingle crystals

1993 ◽  
Vol 48 (6) ◽  
pp. 4067-4073 ◽  
Author(s):  
B. M. Vlcek ◽  
H. K. Viswanathan ◽  
M. C. Frischherz ◽  
S. Fleshler ◽  
K. Vandervoort ◽  
...  
1993 ◽  
Vol 48 (10) ◽  
pp. 6839-6853 ◽  
Author(s):  
Radha D. Banhatti ◽  
Y. V. G. S. Murti

1993 ◽  
Vol 07 (01n03) ◽  
pp. 157-161 ◽  
Author(s):  
D. SURESH BABU ◽  
G. NARSING RAO ◽  
L. BROHAN ◽  
M. GANNE

We report on the ac susceptibility, microwave absorption and dc magnetization of Bi 2− x V x Sr 2 Ca 2 Cu 3 O y (nominal composition). The low T c (2212) phase ( T c = 85 K ) dominates in the x = 0 sample with extremly weak flux pinning. In x = 0.4 sample, both flux pinning and volume fraction of the high T c (2223) phase ( T c = 105 K ) were increased. The intragrain critical current density of the sample with x = 0.4 was estimated and found to be comparable with that of Pb doped Bi 2 Sr 2 Ca 2 Cu 3 O y superconductor. The data suggest that addition of V 2 O 5 in Bi 2 Sr 2 Ca 2 Cu 3 O y system increases the volume fraction of the high T c phase. Probable role of vanadium in enhancing the high T c (2223) phase in Bi-V-Sr-Ca-Cu-O system is discussed.


Nano Express ◽  
2021 ◽  
Vol 2 (1) ◽  
pp. 014005 ◽  
Author(s):  
K Loeto ◽  
G Kusch ◽  
P-M Coulon ◽  
SM Fairclough ◽  
E Le Boulbar ◽  
...  
Keyword(s):  

2001 ◽  
Vol 353-356 ◽  
pp. 323-326 ◽  
Author(s):  
Alexander Mattausch ◽  
M. Bockstedte ◽  
Oleg Pankratov

Author(s):  
Thomas Weatherley ◽  
Wei Liu ◽  
Camille Haller ◽  
Yao Chen ◽  
Duncan T. L. Alexander ◽  
...  
Keyword(s):  

2019 ◽  
Vol 9 (1) ◽  
Author(s):  
Cesare Chiccoli ◽  
Paolo Pasini ◽  
Claudio Zannoni ◽  
Gregor Skačej ◽  
Hiroyuki Yoshida ◽  
...  

AbstractWe have studied nematic hybrid films with homeotropic alignment at the top surface and various controlled degrees of in plane ordering, going from a random degenerate organization to a completely uniform alignment along one direction, at the bottom one. We show, by Monte Carlo (MC) computer simulations and experiments on photopatterned films with the bottom support surface fabricated with in-plane order similar to the simulated ones, that the point defects observed in the case of random planar orientations at the bottom tend to arrange along a filament as the surface ordering is sufficiently increased. MC simulations complement the polarized microscopy texture observations allowing to inspect the 3D structure of the defects and examine the role of elastic constants.


1993 ◽  
Vol 62 (9) ◽  
pp. 958-960 ◽  
Author(s):  
O. O. Awadelkarim ◽  
T. Gu ◽  
P. I. Mikulan ◽  
R. A. Ditizio ◽  
S. J. Fonash ◽  
...  

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