Ballistic-electron-emission microscopy of electron transport through AlAs/GaAs heterostructures

W. J. Kaiser; M. H. Hecht; L. D. Bell; F. J. Grunthaner; J. K. Liu; L. C. Davis

doi:10.1103/physrevb.48.18324

Ballistic-electron-emission microscopy of electron transport through AlAs/GaAs heterostructures

Physical Review B ◽

10.1103/physrevb.48.18324 ◽

1993 ◽

Vol 48 (24) ◽

pp. 18324-18327 ◽

Cited By ~ 37

Author(s):

W. J. Kaiser ◽

M. H. Hecht ◽

L. D. Bell ◽

F. J. Grunthaner ◽

J. K. Liu ◽

...

Keyword(s):

Electron Transport ◽

Electron Emission ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Emission Microscopy

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Ballistic electron emission microscopy: from electron transport physics to nanoscale materials science

10.1117/12.183190 ◽

1993 ◽

Author(s):

Hans D. Hallen

Keyword(s):

Electron Transport ◽

Electron Emission ◽

Materials Science ◽

Nanoscale Materials ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Emission Microscopy

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L-valley electron transport in GaAs-AlAs double-barrier resonant tunneling structures studied by ballistic electron emission microscopy

Physical Review B ◽

10.1103/physrevb.66.033309 ◽

2002 ◽

Vol 66 (3) ◽

Cited By ~ 8

Author(s):

D. Rakoczy ◽

G. Strasser ◽

C. Strahberger ◽

J. Smoliner

Keyword(s):

Electron Transport ◽

Electron Emission ◽

Resonant Tunneling ◽

Ballistic Electron Emission Microscopy ◽

Double Barrier ◽

Ballistic Electron ◽

Emission Microscopy ◽

Double Barrier Resonant Tunneling

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Conduction band energies and hot-electron transport characteristics of epitaxial Sc2O3∕Si (111) studied by ballistic electron emission microscopy and internal photoemission

Applied Physics Letters ◽

10.1063/1.2757150 ◽

2007 ◽

Vol 91 (4) ◽

pp. 042901 ◽

Cited By ~ 8

Author(s):

W. Cai ◽

S. E. Stone ◽

J. P. Pelz ◽

L. F. Edge ◽

D. G. Schlom

Keyword(s):

Electron Transport ◽

Conduction Band ◽

Electron Emission ◽

Hot Electron ◽

Ballistic Electron Emission Microscopy ◽

Internal Photoemission ◽

Ballistic Electron ◽

Emission Microscopy ◽

Hot Electron Transport

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Measuring spin dependent hot electron transport through a metal-semiconductor interface using spin-polarized ballistic electron emission microscopy

Physical Review B ◽

10.1103/physrevb.76.195311 ◽

2007 ◽

Vol 76 (19) ◽

Cited By ~ 3

Author(s):

A. J. Stollenwerk ◽

M. R. Krause ◽

J. J. Garramone ◽

E. J. Spadafora ◽

V. P. LaBella

Keyword(s):

Electron Transport ◽

Electron Emission ◽

Hot Electron ◽

Ballistic Electron Emission Microscopy ◽

Semiconductor Interface ◽

Ballistic Electron ◽

Spin Polarized ◽

Emission Microscopy ◽

Hot Electron Transport

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Hot electron transport studies of the Cu/Si(001) interface using ballistic electron emission microscopy

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ◽

10.1116/1.3136761 ◽

2009 ◽

Vol 27 (4) ◽

pp. 2044 ◽

Cited By ~ 10

Author(s):

J. J. Garramone ◽

J. R. Abel ◽

I. L. Sitnitsky ◽

R. L. Moore ◽

V. P. LaBella

Keyword(s):

Electron Transport ◽

Electron Emission ◽

Hot Electron ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Transport Studies ◽

Emission Microscopy ◽

Hot Electron Transport

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Ballistic-electron emission microscopy at metal/GaP(110) interfaces: Electron transport and Schottky-barrier heights

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.586974 ◽

1993 ◽

Vol 11 (4) ◽

pp. 1584 ◽

Cited By ~ 13

Author(s):

A. Bauer

Keyword(s):

Electron Transport ◽

Schottky Barrier ◽

Electron Emission ◽

Ballistic Electron Emission Microscopy ◽

Barrier Heights ◽

Ballistic Electron ◽

Emission Microscopy

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Electron transport in ballistic electron emission microscopy

Applied Physics A ◽

10.1007/s003390051263 ◽

1998 ◽

Vol 66 (7) ◽

pp. S897-S900 ◽

Cited By ~ 1

Author(s):

R. Menegozzi ◽

P.-G. Reinhard ◽

M. Schulz

Keyword(s):

Electron Transport ◽

Electron Emission ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Emission Microscopy

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Hot-electron transport processes in ballistic-electron emission microscopy at Au–Si interfaces

Journal of Electron Spectroscopy and Related Phenomena ◽

10.1016/s0368-2048(00)00118-3 ◽

2000 ◽

Vol 109 (1-2) ◽

pp. 211-222 ◽

Cited By ~ 14

Author(s):

M. Dähne-Prietsch ◽

T. Kalka

Keyword(s):

Electron Transport ◽

Electron Emission ◽

Transport Processes ◽

Hot Electron ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Emission Microscopy ◽

Hot Electron Transport

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Electron transport in ultra-thin films and ballistic electron emission microscopy

Journal of Physics Condensed Matter ◽

10.1088/1361-648x/aa575e ◽

2017 ◽

Vol 29 (11) ◽

pp. 115001 ◽

Cited By ~ 1

Author(s):

Y Claveau ◽

S Di Matteo ◽

P L de Andres ◽

F Flores

Keyword(s):

Thin Films ◽

Electron Transport ◽

Electron Emission ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Emission Microscopy

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Hot-electron transport through Au/GaAs and Au/GaAs/AlAs heterojunction interfaces: Ballistic-electron-emission-microscopy measurement and Monte Carlo simulation

Physical Review B ◽

10.1103/physrevb.53.4845 ◽

1996 ◽

Vol 53 (8) ◽

pp. 4845-4849 ◽

Cited By ~ 22

Author(s):

Mao-long Ke ◽

D. I. Westwood ◽

C. C. Matthai ◽

B. E. Richardson ◽

R. H. Williams

Keyword(s):

Monte Carlo Simulation ◽

Monte Carlo ◽

Electron Transport ◽

Electron Emission ◽

Hot Electron ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Microscopy Measurement ◽

Emission Microscopy ◽

Hot Electron Transport

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