Analytical approach to the inversion-asymmetry splitting of the valence band in zinc-blende-type semiconductors

1993 ◽  
Vol 48 (16) ◽  
pp. 12285-12288
Author(s):  
Samy S. Montasser
2007 ◽  
Vol 101 (4) ◽  
pp. 046105 ◽  
Author(s):  
Chun-Nan Chen ◽  
Sheng-Hsiung Chang ◽  
Meng-En Lee ◽  
Jih-Chen Chiang ◽  
Ikai Lo ◽  
...  

1998 ◽  
Vol 80 (26) ◽  
pp. 5770-5773 ◽  
Author(s):  
O. Krebs ◽  
D. Rondi ◽  
J. L. Gentner ◽  
L. Goldstein ◽  
P. Voisin

1989 ◽  
Vol 12 (2) ◽  
pp. 1-67 ◽  
Author(s):  
N. Kim ◽  
G. C. La Rocca ◽  
S. Rodriguez ◽  
F. Bassani

2012 ◽  
Vol 85 (4) ◽  
Author(s):  
D. Spirkoska ◽  
Al. L. Efros ◽  
W. R. L. Lambrecht ◽  
T. Cheiwchanchamnangij ◽  
A. Fontcuberta i Morral ◽  
...  

2021 ◽  
Vol 2065 (1) ◽  
pp. 012002
Author(s):  
Yaqun Liu ◽  
Everett X. Wang ◽  
Gary Zhang ◽  
Xiyue Li

Abstract The variations of valence band energy with stress effects in zinc-blende GaN are proposed in this paper. The calculations are based on a six-band strain dependent k·p Hamiltonian, and can be self-consistently solved by Schrödinger-Poisson equation. Accurate physical pictures are given for the quantized valence subband structure under biaxial and uniaxial stress in (001) surface along the [110] direction accounting the quantum confinement effect. The warping of the energy profile results in carrier distribution change. This research will be beneficial for improving the hole mobility and the selective of optimum stress for group-III nitride semiconductor based devices.


1994 ◽  
Vol 50 (23) ◽  
pp. 16956-16963 ◽  
Author(s):  
Denis Bertho ◽  
Jean-Marc Jancu ◽  
Christian Jouanin
Keyword(s):  

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