Nonlocal contributions to the dielectric screening of point donor impurities in semiconductors

1992 ◽  
Vol 45 (20) ◽  
pp. 12088-12090
Author(s):  
S. B. Elegba ◽  
A. I. Amali
Keyword(s):  
Impurities In Semiconductors ◽  
Dielectric Screening

scholarly journals Dielectric screening in perovskite photovoltaics

2021 ◽  
Vol 12 (1) ◽  
Author(s):  
Rui Su ◽  
Zhaojian Xu ◽  
Jiang Wu ◽  
Deying Luo ◽  
Qin Hu ◽  
...  
Keyword(s):  
Open Circuit Voltage ◽  
Low Voltage ◽  
Power Conversion ◽  
Surface Recombination ◽  
Open Circuit ◽  
Phonon Coupling ◽  
Electron Phonon Coupling ◽  
Dielectric Screening ◽  
Perovskite Photovoltaic ◽  
Reduced Surface

AbstractThe performance of perovskite photovoltaics is fundamentally impeded by the presence of undesirable defects that contribute to non-radiative losses within the devices. Although mitigating these losses has been extensively reported by numerous passivation strategies, a detailed understanding of loss origins within the devices remains elusive. Here, we demonstrate that the defect capturing probability estimated by the capture cross-section is decreased by varying the dielectric response, producing the dielectric screening effect in the perovskite. The resulting perovskites also show reduced surface recombination and a weaker electron-phonon coupling. All of these boost the power conversion efficiency to 22.3% for an inverted perovskite photovoltaic device with a high open-circuit voltage of 1.25 V and a low voltage deficit of 0.37 V (a bandgap ~1.62 eV). Our results provide not only an in-depth understanding of the carrier capture processes in perovskites, but also a promising pathway for realizing highly efficient devices via dielectric regulation.

The electronic structure of deep SP-bonded acceptor impurities in semiconductors

1981 ◽  
Vol 37 (9) ◽  
pp. 705-708 ◽  
Author(s):  
J. Bernholc ◽  
S.T. Pantelides ◽  
N.O. Lipari ◽  
A. Baldereschi
Keyword(s):  
Electronic Structure ◽  
Impurities In Semiconductors

scholarly journals LayerPCM: An implicit scheme for dielectric screening from layered substrates

2021 ◽  
Vol 154 (22) ◽  
pp. 224114
Author(s):  
Jannis Krumland ◽  
Gabriel Gil ◽  
Stefano Corni ◽  
Caterina Cocchi
Keyword(s):  
Implicit Scheme ◽  
Dielectric Screening

scholarly journals The Schottky–Mott Rule Expanded for Two-Dimensional Semiconductors: Influence of Substrate Dielectric Screening

ACS Nano ◽  
2021 ◽  
Author(s):  
Soohyung Park ◽  
Thorsten Schultz ◽  
Dongguen Shin ◽  
Niklas Mutz ◽  
Areej Aljarb ◽  
...  
Keyword(s):  
Two Dimensional ◽  
Dielectric Screening ◽  
Influence Of Substrate
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