Electron-energy-loss cross-section and surface lattice-dynamics studies of NiAl(110)

1990 ◽  
Vol 42 (9) ◽  
pp. 5451-5458 ◽  
Author(s):  
Y. Chen ◽  
M. L. Xu ◽  
S. Y. Tong ◽  
M. Wuttig ◽  
W. Hoffmann ◽  
...  
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Cross Section ◽  
Lattice Dynamics ◽  
Surface Lattice ◽  
Electron Energy Loss

A Poor Man’s Approach to Semi-Quantitative Analysis with Electron Energy Loss Spectroscopy

1980 ◽  
Vol 38 ◽  
pp. 110-111
Author(s):  
M. Isaacson
Keyword(s):  
Quantitative Analysis ◽  
Energy Loss ◽  
Electron Energy ◽  
Cross Section ◽  
Electron Energy Loss Spectroscopy ◽  
Excitation Cross Section ◽  
Incident Electron ◽  
Integral Cross Section ◽  
Image Position ◽  
Electron Energy Loss

In an earlier paper1 it was found that to a good approximation, the efficiency of collection of electrons that had lost energy due to an inner shell excitation could be written as where σE was the total excitation cross-section and σE(θ, Δ) was the integral cross-section for scattering within an angle θ and with an energy loss up to an energy Δ from the excitation edge, EE. We then obtained: where , with P being the momentum of the incident electron of velocity v. The parameter r was due to the assumption that d2σ/dEdΩ∞E−r for energy loss E. In reference 1 it was assumed that r was a constant.

The Influence of Diffracting Conditions on Quantitative Electron Energy Loss Spectroscopy

1980 ◽  
Vol 38 ◽  
pp. 114-115
Author(s):  
N. J. Zaluzec ◽  
J. Hren ◽  
R. W. Carpenter
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Cross Section ◽  
Electron Energy Loss Spectroscopy ◽  
Ionization Cross ◽  
Crystalline Materials ◽  
X Ray ◽  
Scattering Effects ◽  
Electron Energy Loss ◽  
Multiple Scattering Effects

Since many applications of electron energy loss spectroscopy (EELS) deal with microanalysis of crystalline materials it is relevant to consider the effects of diffracting conditions on an EELS measurement. It is well known that anamolous effects can be observed during thin film x-ray microanalysis when crystalline materials are oriented under diffracting conditions near S = 0.1-4 It is not surprizing, therefore, that similar effects will be present in EELS, since this anamolous x-ray generation is a result of variations in the ionization cross-section with crystalline orientation2,3. Furthermore since multiple scattering effects quickly average out these perturbations2 one expects the most pronounced effects under conditions appropriate to EELS.5

QUANTITATIVE ANALYSIS OF NONCONTINUOUS THIN FILMS BY EELS

1999 ◽  
Vol 06 (05) ◽  
pp. 801-804 ◽  
Author(s):  
V. MATOLÍN ◽  
I. STARÁ
Keyword(s):  
Thin Films ◽  
Quantitative Analysis ◽  
Differential Cross Section ◽  
Energy Loss ◽  
Electron Energy ◽  
Cross Section ◽  
Sapphire Substrate ◽  
Primary Electron ◽  
Electron Energy Loss ◽  
Reference Samples

Reflection electron energy loss spectroscopy (EELS) operated at low primary electron energy Ep (~ 500 eV) can be used as a coverage-sensitive probe in the case of supported noncontinuous layers. Quantitative analysis by EELS is substantially complicated by the fact that EEL intensity depends on two material factors: K(E), differential cross section for energy loss of E, and electron backscattering factor η(Ep). Both factors were determined experimentally using deposit and substrate reference samples. The contribution of pure substrate and pure deposit EEL curves to composed EEL spectra of the investigated deposit/substrate system has been found by fitting it with combination of reference K(E)λ curves (λ stands for IMFP). The fit results corrected using η(Ep) factors permitted one to evaluate the deposit coverage. The method was tested using the reference Au fractional deposit on the sapphire substrate.

Comparison of electron energy-loss and quantitative optical spectroscopy on individual optical gold antennas

Nanophotonics ◽  
2013 ◽  
Vol 2 (4) ◽  
pp. 241-245 ◽  
Author(s):  
Martin Husnik ◽  
Felix von Cube ◽  
Stephan Irsen ◽  
Stefan Linden ◽  
Jens Niegemann ◽  
...  
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Optical Spectroscopy ◽  
Cross Section ◽  
Optical Antennas ◽  
Large Set ◽  
Optical Extinction ◽  
Experimental Errors ◽  
Electron Energy Loss ◽  
Electron Energy Loss Spectra

AbstractUsing a rather large set of different individual metallic optical antennas, we compare directly measured electron energy-loss spectra with measured quantitative optical extinction and scattering cross-section spectra on the identical antennas. All antenna resonances lie near 1.4 µm wavelength. In contrast to other reports, we find identical resonance positions for electrons and photons to within the experimental errors. We discuss possible artifacts which can lead to seemingly different resonance positions in experiments. Our experimental results agree well with complete numerical calculations of both sorts of spectra.

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