Oxygen-nickel bond length in Ni(111)-p(2×2)O determined by electron-energy-loss fine-structure spectroscopy

L. S. Caputi; S. L. Jiang; A. Amoddeo; R. Tucci

doi:10.1103/physrevb.41.8513

Oxygen-nickel bond length in Ni(111)-p(2×2)O determined by electron-energy-loss fine-structure spectroscopy

Physical Review B ◽

10.1103/physrevb.41.8513 ◽

1990 ◽

Vol 41 (12) ◽

pp. 8513-8515 ◽

Cited By ~ 25

Author(s):

L. S. Caputi ◽

S. L. Jiang ◽

A. Amoddeo ◽

R. Tucci

Keyword(s):

Fine Structure ◽

Energy Loss ◽

Bond Length ◽

Electron Energy ◽

Electron Energy Loss

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Extended x-ray-absorption and electron-energy-loss fine-structure studies of the local atomic structure of amorphous unhydrogenated and hydrogenated silicon carbide

Physical Review B ◽

10.1103/physrevb.38.13099 ◽

1988 ◽

Vol 38 (18) ◽

pp. 13099-13106 ◽

Cited By ~ 43

Author(s):

Alain E. Kaloyeros ◽

Richard B. Rizk ◽

John B. Woodhouse

Keyword(s):

Silicon Carbide ◽

Fine Structure ◽

Energy Loss ◽

Electron Energy ◽

Atomic Structure ◽

Local Atomic Structure ◽

Hydrogenated Silicon ◽

X Ray ◽

Electron Energy Loss ◽

X Ray Absorption

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Extended Fine Structure on the Carbon Core-Ionization Edge Obtained from Nanometer-Sized Areas with Electron-Energy-Loss Spectroscopy

Physical Review Letters ◽

10.1103/physrevlett.42.893 ◽

1979 ◽

Vol 42 (14) ◽

pp. 893-897 ◽

Cited By ~ 51

Author(s):

P. E. Batson ◽

A. J. Craven

Keyword(s):

Fine Structure ◽

Energy Loss ◽

Electron Energy ◽

Electron Energy Loss Spectroscopy ◽

Carbon Core ◽

Electron Energy Loss ◽

Ionization Edge

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Local bond length variations in boron-doped nanocrystalline diamond measured by spatially resolved electron energy-loss spectroscopy

Applied Physics Letters ◽

10.1063/1.4813842 ◽

2013 ◽

Vol 103 (3) ◽

pp. 032105 ◽

Cited By ~ 14

Author(s):

Ying-Gang Lu ◽

Stuart Turner ◽

Johan Verbeeck ◽

Stoffel D. Janssens ◽

Ken Haenen ◽

...

Keyword(s):

Energy Loss ◽

Bond Length ◽

Electron Energy ◽

Electron Energy Loss Spectroscopy ◽

Nanocrystalline Diamond ◽

Spatially Resolved ◽

Boron Doped ◽

Electron Energy Loss

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The Theory and Interpretation of Electron Energy Loss Near-Edge Fine Structure

Annual Review of Materials Research ◽

10.1146/annurev.matsci.37.052506.084209 ◽

2008 ◽

Vol 38 (1) ◽

pp. 535-558 ◽

Cited By ~ 40

Author(s):

Peter Rez ◽

David A. Muller

Keyword(s):

Fine Structure ◽

Energy Loss ◽

Electron Energy ◽

Electron Energy Loss

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Wavevector-dependent fine structure in the electron energy-loss spectrum of aluminium

Journal of Physics D Applied Physics ◽

10.1088/0022-3727/10/1/006 ◽

1977 ◽

Vol 10 (1) ◽

pp. 49-53 ◽

Cited By ~ 10

Author(s):

M Urner-Wille

Keyword(s):

Fine Structure ◽

Energy Loss ◽

Electron Energy ◽

Electron Energy Loss Spectrum ◽

Electron Energy Loss

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Application of TEM extended electron energy loss fine structure to the study of aluminium oxide films

Philosophical Magazine A ◽

10.1080/01418618408233278 ◽

1984 ◽

Vol 49 (3) ◽

pp. 341-352 ◽

Cited By ~ 44

Author(s):

A. J. Bourdillon ◽

S. M. El-mashri ◽

A. J. Forty

Keyword(s):

Fine Structure ◽

Energy Loss ◽

Electron Energy ◽

Oxide Films ◽

Aluminium Oxide ◽

Electron Energy Loss

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Comment on ‘Extended electron energy loss fine structure simulation of the local boron environment in sodium aluminosilicate glasses containing gadolinium’ by M. Qian, H. Li, L. Li and D.M. Strachan [J. Non-Cryst. Solids 328 (2003) 90]

Journal of Non-Crystalline Solids ◽

10.1016/j.jnoncrysol.2004.07.052 ◽

2005 ◽

Vol 351 (2) ◽

pp. 184-185 ◽

Cited By ~ 1

Author(s):

N. Jiang ◽

J.C.H. Spence

Keyword(s):

Fine Structure ◽

Energy Loss ◽

Electron Energy ◽

Sodium Aluminosilicate ◽

Aluminosilicate Glasses ◽

Structure Simulation ◽

Electron Energy Loss

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Determination of the parameters of atomic pair correlations in nickel oxide films by the electron energy loss fine structure method

Journal of Structural Chemistry ◽

10.1007/s10947-009-0037-8 ◽

2009 ◽

Vol 50 (2) ◽

pp. 260-267

Author(s):

D. E. Guy ◽

O. R. Bakieva ◽

A. N. Deev ◽

F. Z. Gilmutdinov

Keyword(s):

Fine Structure ◽

Energy Loss ◽

Nickel Oxide ◽

Electron Energy ◽

Oxide Films ◽

Pair Correlations ◽

Atomic Pair ◽

Electron Energy Loss ◽

Nickel Oxide Films

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Near‐edge fine‐structure analysis of core‐shell electronic absorption edges in silicon and its refractory compounds with the use of electron‐energy‐loss microspectroscopy

Journal of Applied Physics ◽

10.1063/1.339451 ◽

1987 ◽

Vol 62 (6) ◽

pp. 2439-2449 ◽

Cited By ~ 34

Author(s):

W. M. Skiff ◽

R. W. Carpenter ◽

S. H. Lin

Keyword(s):

Fine Structure ◽

Energy Loss ◽

Electron Energy ◽

Structure Analysis ◽

Electronic Absorption ◽

Core Shell ◽

Refractory Compounds ◽

Fine Structure Analysis ◽

Electron Energy Loss ◽

Absorption Edges

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Comparison of the TiK extended fine structure obtained from electron energy loss spectroscopy and x-ray absorption spectroscopy

Ultramicroscopy ◽

10.1016/0304-3991(93)90004-h ◽

1993 ◽

Vol 50 (2) ◽

pp. 141-145 ◽

Cited By ~ 13

Author(s):

G. Blanche ◽

G. Hug ◽

M. Jaouen ◽

A.M. Flank

Keyword(s):

Fine Structure ◽

Energy Loss ◽

Electron Energy ◽

Absorption Spectroscopy ◽

Electron Energy Loss Spectroscopy ◽

X Ray ◽

Electron Energy Loss ◽

X Ray Absorption

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