Extended x-ray-absorption and electron-energy-loss fine-structure studies of the local atomic structure of amorphous unhydrogenated and hydrogenated silicon carbide

1988 ◽  
Vol 38 (18) ◽  
pp. 13099-13106 ◽  
Author(s):  
Alain E. Kaloyeros ◽  
Richard B. Rizk ◽  
John B. Woodhouse
Keyword(s):  
Silicon Carbide ◽  
Fine Structure ◽  
Energy Loss ◽  
Electron Energy ◽  
Atomic Structure ◽  
Local Atomic Structure ◽  
Hydrogenated Silicon ◽  
X Ray ◽  
Electron Energy Loss ◽  
X Ray Absorption

scholarly journals Core-hole effects on theoretical electron-energy-loss near-edge structure and near-edge x-ray absorption fine structure of MgO

2000 ◽  
Vol 61 (3) ◽  
pp. 2180-2187 ◽  
Author(s):  
Teruyasu Mizoguchi ◽  
Isao Tanaka ◽  
Masato Yoshiya ◽  
Fumiyasu Oba ◽  
Kazuyoshi Ogasawara ◽  
...  
Keyword(s):  
Fine Structure ◽  
Energy Loss ◽  
Electron Energy ◽  
Core Hole ◽  
Edge Structure ◽  
X Ray ◽  
Absorption Fine ◽  
Electron Energy Loss ◽  
X Ray Absorption

Comparison between extended x-ray-absorption and extended electron energy-loss fine-structure results above theM2,3edge of cobalt

1985 ◽  
Vol 32 (12) ◽  
pp. 7826-7829 ◽  
Author(s):  
M. Fanfoni ◽  
S. Modesti ◽  
N. Motta ◽  
M. De Crescenzi ◽  
R. Rosei
Keyword(s):  
Fine Structure ◽  
Energy Loss ◽  
Electron Energy ◽  
X Ray ◽  
Electron Energy Loss ◽  
X Ray Absorption

Calculations of oxygen electron energy loss near edge structure

1987 ◽  
Vol 45 ◽  
pp. 128-129
Author(s):  
Xudong Weng ◽  
Peter Rez
Keyword(s):  
Fine Structure ◽  
Electron Microscope ◽  
Energy Loss ◽  
Electron Energy ◽  
Nearest Neighbour ◽  
Edge Structure ◽  
X Ray ◽  
Electron Energy Loss ◽  
X Ray Absorption ◽  
Widespread Interest

Most analytical microscopes are equipped with energy loss spectrometers capable of giving spectra showing 1-2 eV resolution for inner shell edges. The relatively weak modulation starting 30-50 eV from threshold due to Extended X-ray Edge Energy Loss Fine Structure (EXELFS) which is analogous to EXAFS in X-ray absorption has been studied in some detail. Although the theory is, in principle, straightforward the technique using energy loss in the electron microscope to determine nearest neighbour distances has not attracted widespread interest. This is partly due to the long counting times involved. The near edge structure (NES) within 20-30 eV of threshold is characterized by a very strong modulation and is clearly visible even when small amounts of the element are present. Interpretation of the features is very much more difficult and except in those cases in which peaks can be clearly assigned to transitions to antibonding orbitals the main form of analysis has been limited to simple comparisons or fingerprinting.

The spatial resolution of electron energy loss and x-ray absorption fine structure

2008 ◽  
Vol 104 (3) ◽  
pp. 034906 ◽  
Author(s):  
Feng Wang ◽  
Ray F. Egerton ◽  
Marek Malac ◽  
Robert A. McLeod ◽  
M. Sergio Moreno
Keyword(s):  
Fine Structure ◽  
Energy Loss ◽  
Electron Energy ◽  
Spatial Resolution ◽  
X Ray ◽  
Absorption Fine ◽  
Electron Energy Loss ◽  
X Ray Absorption
Sign in / Sign up

Export Citation Format

Share Document