Near‐edge fine‐structure analysis of core‐shell electronic absorption edges in silicon and its refractory compounds with the use of electron‐energy‐loss microspectroscopy

W. M. Skiff; R. W. Carpenter; S. H. Lin

doi:10.1063/1.339451

Near‐edge fine‐structure analysis of core‐shell electronic absorption edges in silicon and its refractory compounds with the use of electron‐energy‐loss microspectroscopy

Journal of Applied Physics ◽

10.1063/1.339451 ◽

1987 ◽

Vol 62 (6) ◽

pp. 2439-2449 ◽

Cited By ~ 34

Author(s):

W. M. Skiff ◽

R. W. Carpenter ◽

S. H. Lin

Keyword(s):

Fine Structure ◽

Energy Loss ◽

Electron Energy ◽

Structure Analysis ◽

Electronic Absorption ◽

Core Shell ◽

Refractory Compounds ◽

Fine Structure Analysis ◽

Electron Energy Loss ◽

Absorption Edges

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Fine structure analysis of near‐edge electron energy loss spectra related to the compositional variation at the diffuse interfaces in FeGe multilayers

Journal of Applied Physics ◽

10.1063/1.362894 ◽

1996 ◽

Vol 80 (2) ◽

pp. 853-858 ◽

Cited By ~ 7

Author(s):

K. Suenaga ◽

A. Thorel ◽

Ph. Houdy ◽

C. Colliex

Keyword(s):

Fine Structure ◽

Energy Loss ◽

Electron Energy ◽

Structure Analysis ◽

Compositional Variation ◽

Diffuse Interfaces ◽

Fine Structure Analysis ◽

Electron Energy Loss ◽

Electron Energy Loss Spectra

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Extended electron energy loss fine structure analysis of amorphous Al2O3

Philosophical Magazine A ◽

10.1080/01418619208205616 ◽

1992 ◽

Vol 65 (6) ◽

pp. 1445-1461 ◽

Cited By ~ 11

Author(s):

P. S. Sklad ◽

P. Angelini ◽

J. Sevely

Keyword(s):

Fine Structure ◽

Energy Loss ◽

Electron Energy ◽

Structure Analysis ◽

Fine Structure Analysis ◽

Electron Energy Loss ◽

Amorphous Al2o3

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Application of a semiempirical self‐consistent‐field band calculation to near‐edge fine‐structure analysis of core‐shell electronic absorption edges

Journal of Applied Physics ◽

10.1063/1.343158 ◽

1989 ◽

Vol 65 (12) ◽

pp. 5217-5220 ◽

Cited By ~ 1

Author(s):

H. Ma ◽

W. M. Skiff ◽

G. S. Wu ◽

S. H. Lin ◽

R. W. Carpenter

Keyword(s):

Fine Structure ◽

Structure Analysis ◽

Electronic Absorption ◽

Core Shell ◽

Band Calculation ◽

Consistent Field ◽

Fine Structure Analysis ◽

Self Consistent ◽

Self Consistent Field ◽

Absorption Edges

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Extended x-ray-absorption and electron-energy-loss fine-structure studies of the local atomic structure of amorphous unhydrogenated and hydrogenated silicon carbide

Physical Review B ◽

10.1103/physrevb.38.13099 ◽

1988 ◽

Vol 38 (18) ◽

pp. 13099-13106 ◽

Cited By ~ 43

Author(s):

Alain E. Kaloyeros ◽

Richard B. Rizk ◽

John B. Woodhouse

Keyword(s):

Silicon Carbide ◽

Fine Structure ◽

Energy Loss ◽

Electron Energy ◽

Atomic Structure ◽

Local Atomic Structure ◽

Hydrogenated Silicon ◽

X Ray ◽

Electron Energy Loss ◽

X Ray Absorption

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Extended Fine Structure on the Carbon Core-Ionization Edge Obtained from Nanometer-Sized Areas with Electron-Energy-Loss Spectroscopy

Physical Review Letters ◽

10.1103/physrevlett.42.893 ◽

1979 ◽

Vol 42 (14) ◽

pp. 893-897 ◽

Cited By ~ 51

Author(s):

P. E. Batson ◽

A. J. Craven

Keyword(s):

Fine Structure ◽

Energy Loss ◽

Electron Energy ◽

Electron Energy Loss Spectroscopy ◽

Carbon Core ◽

Electron Energy Loss ◽

Ionization Edge

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The Theory and Interpretation of Electron Energy Loss Near-Edge Fine Structure

Annual Review of Materials Research ◽

10.1146/annurev.matsci.37.052506.084209 ◽

2008 ◽

Vol 38 (1) ◽

pp. 535-558 ◽

Cited By ~ 40

Author(s):

Peter Rez ◽

David A. Muller

Keyword(s):

Fine Structure ◽

Energy Loss ◽

Electron Energy ◽

Electron Energy Loss

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Wavevector-dependent fine structure in the electron energy-loss spectrum of aluminium

Journal of Physics D Applied Physics ◽

10.1088/0022-3727/10/1/006 ◽

1977 ◽

Vol 10 (1) ◽

pp. 49-53 ◽

Cited By ~ 10

Author(s):

M Urner-Wille

Keyword(s):

Fine Structure ◽

Energy Loss ◽

Electron Energy ◽

Electron Energy Loss Spectrum ◽

Electron Energy Loss

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Application of TEM extended electron energy loss fine structure to the study of aluminium oxide films

Philosophical Magazine A ◽

10.1080/01418618408233278 ◽

1984 ◽

Vol 49 (3) ◽

pp. 341-352 ◽

Cited By ~ 44

Author(s):

A. J. Bourdillon ◽

S. M. El-mashri ◽

A. J. Forty

Keyword(s):

Fine Structure ◽

Energy Loss ◽

Electron Energy ◽

Oxide Films ◽

Aluminium Oxide ◽

Electron Energy Loss

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Comment on ‘Extended electron energy loss fine structure simulation of the local boron environment in sodium aluminosilicate glasses containing gadolinium’ by M. Qian, H. Li, L. Li and D.M. Strachan [J. Non-Cryst. Solids 328 (2003) 90]

Journal of Non-Crystalline Solids ◽

10.1016/j.jnoncrysol.2004.07.052 ◽

2005 ◽

Vol 351 (2) ◽

pp. 184-185 ◽

Cited By ~ 1

Author(s):

N. Jiang ◽

J.C.H. Spence

Keyword(s):

Fine Structure ◽

Energy Loss ◽

Electron Energy ◽

Sodium Aluminosilicate ◽

Aluminosilicate Glasses ◽

Structure Simulation ◽

Electron Energy Loss

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Determination of the parameters of atomic pair correlations in nickel oxide films by the electron energy loss fine structure method

Journal of Structural Chemistry ◽

10.1007/s10947-009-0037-8 ◽

2009 ◽

Vol 50 (2) ◽

pp. 260-267

Author(s):

D. E. Guy ◽

O. R. Bakieva ◽

A. N. Deev ◽

F. Z. Gilmutdinov

Keyword(s):

Fine Structure ◽

Energy Loss ◽

Nickel Oxide ◽

Electron Energy ◽

Oxide Films ◽

Pair Correlations ◽

Atomic Pair ◽

Electron Energy Loss ◽

Nickel Oxide Films

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