Depth dependence for extended x-ray-absorption fine-structure spectroscopy detected via electron yield in He and in vacuum

1988 ◽  
Vol 38 (1) ◽  
pp. 26-30 ◽  
Author(s):  
W. T. Elam ◽  
J. P. Kirkland ◽  
R. A. Neiser ◽  
P. D. Wolf
Keyword(s):  
Fine Structure ◽  
X Ray ◽  
Depth Dependence ◽  
Absorption Fine ◽  
Electron Yield ◽  
X Ray Absorption

scholarly journals Total-electron-yield current measurements for near-surface extended x-ray-absorption fine structure

1988 ◽  
Vol 37 (5) ◽  
pp. 2450-2464 ◽  
Author(s):  
A. Erbil ◽  
G. S. Cargill III ◽  
R. Frahm ◽  
R. F. Boehme
Keyword(s):  
Fine Structure ◽  
Total Electron Yield ◽  
Total Electron ◽  
Near Surface ◽  
X Ray ◽  
Absorption Fine ◽  
Electron Yield ◽  
X Ray Absorption
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