Ambipolar drift-length measurement in amorphous hydrogenated silicon using the steady-state photocarrier grating technique
Keyword(s):
1985 ◽
Vol 72
(2-3)
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pp. 199-210
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1993 ◽
Vol 164-166
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pp. 235-238
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Keyword(s):
1998 ◽
Vol 1
(2)
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pp. 81-85
Keyword(s):
1996 ◽
Vol 43
(9)
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pp. 1592-1601
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Keyword(s):
1988 ◽
Vol 92
(11)
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pp. 1350-1353
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