X-ray standing-wave determination of surface structure: Au on Si(111)

1986 ◽  
Vol 33 (6) ◽  
pp. 4402-4405 ◽  
Author(s):  
S. M. Durbin ◽  
L. E. Berman ◽  
B. W. Batterman ◽  
J. M. Blakely
Keyword(s):  
Surface Structure ◽  
Standing Wave ◽  
X Ray

A simple X-ray standing wave technique for surface structure determination - theory and an application

1988 ◽  
Vol 195 (1-2) ◽  
pp. 237-254 ◽  
Author(s):  
D.P. Woodruff ◽  
D.L. Seymour ◽  
C.F. McConville ◽  
C.E. Riley ◽  
M.D. Crapper ◽  
...  
Keyword(s):  
Surface Structure ◽  
Standing Wave ◽  
Structure Determination ◽  
X Ray ◽  
Wave Technique

Determination of preferential molecular orientation in porphyrin-fullerene dyad ZnDHD6ee monolayers by the X-ray standing-wave method and X-ray reflectometry

2013 ◽  
Vol 58 (6) ◽  
pp. 934-938 ◽  
Author(s):  
A. Yu. Seregin ◽  
Yu. A. D’yakova ◽  
S. N. Yakunin ◽  
I. A. Makhotkin ◽  
A. S. Alekseev ◽  
...  
Keyword(s):  
Standing Wave ◽  
Molecular Orientation ◽  
Wave Method ◽  
X Ray ◽  
Standing Wave Method

scholarly journals Exafs Studies of Multilayer Interfaces

1988 ◽  
Vol 143 ◽  
Author(s):  
S. M. Heald ◽  
G. M. Lamble
Keyword(s):  
Fine Structure ◽  
Standing Wave ◽  
Structural Disorder ◽  
Interface Structure ◽  
X Ray ◽  
Absorption Fine ◽  
High Degree ◽  
X Ray Absorption ◽  
Multilayer Materials

AbstractImportant for the understanding of multilayer materials is a determination of their interface structure. The extended x-ray absorption fine structure (EXAFS) technique can be useful, particularly for interfaces with a high degree of structural disorder. This paper reviews the application of EXAFS to multilayers, and describes the standing wave enhancement of the EXAFS from multilayer interfaces. Examples are given for W-C and Ni- Ti multilayers.

scholarly journals Total structure determination of surface doping [Ag46Au24(SR)32](BPh4)2 nanocluster and its structure-related catalytic property

2015 ◽  
Vol 1 (7) ◽  
pp. e1500441 ◽  
Author(s):  
Shuxin Wang ◽  
Shan Jin ◽  
Sha Yang ◽  
Shuang Chen ◽  
Yongbo Song ◽  
...  
Keyword(s):  
Surface Structure ◽  
Catalytic Property ◽  
Surface Characterization ◽  
Structure Effect ◽  
Crystallographic Structure ◽  
X Ray ◽  
First Case ◽  
Basic Understanding ◽  
Total Structure

The structure effect is widely present in the catalysis of alloy systems. However, the surface structure of this system is still ambiguous because of the limitations of the current surface characterization tools. We reported the x-ray crystallographic structure of the first and the largest AgAu alloy nanocluster with a doping shell formulated as [Ag46Au24(SR)32](BPh4)2. This nanocluster consists of an achiral bimetallic Ag2@Au18@Ag20 core protected by a chiral Ag24Au6(SR)32 shell. The catalysis experiments further revealed that the surface structure affects the selectivity of products significantly. This is the first case to find the structure effect in atomically precise alloy nanoclusters. Our work will benefit the basic understanding of bimetal distribution, as well as the structure-related catalytic property of alloy nanoclusters at the atomic level.

Structural determination of the (111) -(√3 × √3) 30°- surface using the normal incidence X-ray standing wave method

1995 ◽  
Vol 324 (2-3) ◽  
pp. 122-132 ◽  
Author(s):  
M.F. Kadodwala ◽  
A.A. Davis ◽  
G. Scragg ◽  
B.C.C. Cowie ◽  
M. Kerkar ◽  
...  
Keyword(s):  
Standing Wave ◽  
Normal Incidence ◽  
Structural Determination ◽  
Wave Method ◽  
X Ray ◽  
Standing Wave Method

Determination Of The α-Al2O3(0001) Surface Relaxation and Termination by Measurements of Crystal Truncation Rods

1996 ◽  
Vol 437 ◽  
Author(s):  
P. Guenard ◽  
G. Renaud ◽  
A. Barbier ◽  
M. Gautier-Soyer
Keyword(s):  
Surface Structure ◽  
Chemical Nature ◽  
Theoretical Calculations ◽  
Grazing Incidence ◽  
Surface Relaxation ◽  
X Ray ◽  
X Ray Scattering ◽  
Α Al2o3 ◽  
Ray Scattering

AbstractWe have investigated the unreconstructed (0001) surface structure of sapphire (α-Al2O3) by Grazing Incidence X-ray Scattering. Modulations along the crystal truncation rods were analyzed in order to determine the chemical nature of the terminating plane, and the structural relaxations of the first few atomic planes below the surface. The most likely model yields a single Al layer termination with relaxations of the first four planes of -51%, +16%, -29% and +20% respectively. These results compare well with the most recent theoretical calculations on this surface.

scholarly journals Structure determination of theCoSi2:Si(111) interface by x-ray standing-wave analysis

1987 ◽  
Vol 36 (9) ◽  
pp. 4769-4773 ◽  
Author(s):  
A. E. M. J. Fischer ◽  
E. Vlieg ◽  
J. F. van der Veen ◽  
M. Clausnitzer ◽  
G. Materlik
Keyword(s):  
Standing Wave ◽  
Structure Determination ◽  
Wave Analysis ◽  
X Ray

Non-dipole photoemission effects in x-ray standing wavefield determination of surface structure

1998 ◽  
Vol 10 (35) ◽  
pp. L623-L629 ◽  
Author(s):  
C J Fisher ◽  
R Ithin ◽  
R G Jones ◽  
G J Jackson ◽  
D P Woodruff ◽  
...  
Keyword(s):  
Surface Structure ◽  
X Ray
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