scholarly journals Determination of the position and vibrational amplitude of an adsorbate by means of multiple-order x-ray standing-wave measurements

1985 ◽  
Vol 31 (6) ◽  
pp. 4110-4112 ◽  
Author(s):  
M. J. Bedzyk ◽  
G. Materlik
Keyword(s):  
Standing Wave ◽  
Vibrational Amplitude ◽  
X Ray ◽  
Wave Measurements

scholarly journals Probing the geometry of copper and silver adatoms on magnetite: quantitative experiment versus theory

Nanoscale ◽  
2018 ◽  
Vol 10 (5) ◽  
pp. 2226-2230 ◽  
Author(s):  
Matthias Meier ◽  
Zdeněk Jakub ◽  
Jan Balajka ◽  
Jan Hulva ◽  
Roland Bliem ◽  
...  
Keyword(s):  
Dft Calculations ◽  
Standing Wave ◽  
Normal Incidence ◽  
X Ray ◽  
Wave Measurements ◽  
Experiment Versus ◽  
Silver Adatoms

Benchmarking DFT calculations against precise normal incidence X-ray standing wave measurements.

Determination of preferential molecular orientation in porphyrin-fullerene dyad ZnDHD6ee monolayers by the X-ray standing-wave method and X-ray reflectometry

2013 ◽  
Vol 58 (6) ◽  
pp. 934-938 ◽  
Author(s):  
A. Yu. Seregin ◽  
Yu. A. D’yakova ◽  
S. N. Yakunin ◽  
I. A. Makhotkin ◽  
A. S. Alekseev ◽  
...  
Keyword(s):  
Standing Wave ◽  
Molecular Orientation ◽  
Wave Method ◽  
X Ray ◽  
Standing Wave Method

scholarly journals Exafs Studies of Multilayer Interfaces

1988 ◽  
Vol 143 ◽  
Author(s):  
S. M. Heald ◽  
G. M. Lamble
Keyword(s):  
Fine Structure ◽  
Standing Wave ◽  
Structural Disorder ◽  
Interface Structure ◽  
X Ray ◽  
Absorption Fine ◽  
High Degree ◽  
X Ray Absorption ◽  
Multilayer Materials

AbstractImportant for the understanding of multilayer materials is a determination of their interface structure. The extended x-ray absorption fine structure (EXAFS) technique can be useful, particularly for interfaces with a high degree of structural disorder. This paper reviews the application of EXAFS to multilayers, and describes the standing wave enhancement of the EXAFS from multilayer interfaces. Examples are given for W-C and Ni- Ti multilayers.

Contributions of multipole terms to the photoelectric yield in X-ray standing-wave measurements

1997 ◽  
Vol 19 (2-4) ◽  
pp. 617-624 ◽  
Author(s):  
I. A. Vartanyants ◽  
J. Zegenhagen
Keyword(s):  
Standing Wave ◽  
X Ray ◽  
Wave Measurements

Lattice position of Si in GaAs determined by x‐ray standing wave measurements

1993 ◽  
Vol 73 (12) ◽  
pp. 8161-8168
Author(s):  
A. Shih ◽  
P. L. Cowan ◽  
S. Southworth ◽  
L. Fotiadis ◽  
C. Hor ◽  
...  
Keyword(s):  
Standing Wave ◽  
X Ray ◽  
Wave Measurements ◽  
Lattice Position

Structural determination of the (111) -(√3 × √3) 30°- surface using the normal incidence X-ray standing wave method

1995 ◽  
Vol 324 (2-3) ◽  
pp. 122-132 ◽  
Author(s):  
M.F. Kadodwala ◽  
A.A. Davis ◽  
G. Scragg ◽  
B.C.C. Cowie ◽  
M. Kerkar ◽  
...  
Keyword(s):  
Standing Wave ◽  
Normal Incidence ◽  
Structural Determination ◽  
Wave Method ◽  
X Ray ◽  
Standing Wave Method

scholarly journals Structure determination of theCoSi2:Si(111) interface by x-ray standing-wave analysis

1987 ◽  
Vol 36 (9) ◽  
pp. 4769-4773 ◽  
Author(s):  
A. E. M. J. Fischer ◽  
E. Vlieg ◽  
J. F. van der Veen ◽  
M. Clausnitzer ◽  
G. Materlik
Keyword(s):  
Standing Wave ◽  
Structure Determination ◽  
Wave Analysis ◽  
X Ray

X-ray standing-wave determination of surface structure: Au on Si(111)

1986 ◽  
Vol 33 (6) ◽  
pp. 4402-4405 ◽  
Author(s):  
S. M. Durbin ◽  
L. E. Berman ◽  
B. W. Batterman ◽  
J. M. Blakely
Keyword(s):  
Surface Structure ◽  
Standing Wave ◽  
X Ray
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