Determination Of The α-Al2O3(0001) Surface Relaxation and Termination by Measurements of Crystal Truncation Rods

1996 ◽  
Vol 437 ◽  
Author(s):  
P. Guenard ◽  
G. Renaud ◽  
A. Barbier ◽  
M. Gautier-Soyer
Keyword(s):  
Surface Structure ◽  
Chemical Nature ◽  
Theoretical Calculations ◽  
Grazing Incidence ◽  
Surface Relaxation ◽  
X Ray ◽  
X Ray Scattering ◽  
Α Al2o3 ◽  
Ray Scattering

AbstractWe have investigated the unreconstructed (0001) surface structure of sapphire (α-Al2O3) by Grazing Incidence X-ray Scattering. Modulations along the crystal truncation rods were analyzed in order to determine the chemical nature of the terminating plane, and the structural relaxations of the first few atomic planes below the surface. The most likely model yields a single Al layer termination with relaxations of the first four planes of -51%, +16%, -29% and +20% respectively. These results compare well with the most recent theoretical calculations on this surface.

Determination of the α-Ai2O3(0001) Surface Relaxation and Termination by Measurements of Crystal Truncation Rods

1998 ◽  
Vol 05 (01) ◽  
pp. 321-324 ◽  
Author(s):  
P. Guénard ◽  
G. Renaud ◽  
A. Barbier ◽  
M. Gautier-Soyer
Keyword(s):  
Surface Structure ◽  
Chemical Nature ◽  
Theoretical Calculations ◽  
Grazing Incidence ◽  
Surface Relaxation ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

We have investigated the unreconstructed (0001) surface structure of sapphire (α- Al 2 O 3) by grazing incidence X-ray scattering. Modulations along the crystal truncation rods were analyzed in order to determine the chemical nature of the terminating plane, and the structural relaxations of the first few atomic planes below the surfoce. The most likely model yields a single Al layer termination with relaxations of the first four planes of -51%, +16%, -29% and +20% respectively. These results compare well with the most recent theoretical calculations on this surface.

Determination of Strain Distributions in Aluminum Thin Films as a Function of Temperature by the use of Synchrotron Grazing Incidence X-Ray Scattering

1991 ◽  
Vol 239 ◽  
Author(s):  
Ramnath Venkatraman ◽  
Paul R. Besser ◽  
Sean Brennan ◽  
John C. Bravman
Keyword(s):  
Thin Films ◽  
Room Temperature ◽  
Grazing Incidence ◽  
Surface Relaxation ◽  
Line Broadening ◽  
X Ray ◽  
Relaxation Effects ◽  
X Ray Scattering ◽  
Ray Scattering

ABSTRACTWe have measured elastic strain distributions with depth as a function of temperature in Al thin films of various thicknesses on oxidized silicon using synchrotron grazing incidence X-ray scattering (GIXS). Disregarding minor surface relaxation effects that depend on the film thickness, it is shown that there are no gross strain gradients in these films in the range of temperatures (between room temperature and 400°C) considered. We also observe X-ray line broadening effects, suggesting an accumulation of dislocations on cooling the films, and their annealing out as the films are reheated.

Determination of the cubic to hexagonal fraction in GaN nucleation layers using grazing incidence x-ray scattering

1998 ◽  
Vol 72 (23) ◽  
pp. 2972-2974 ◽  
Author(s):  
A. Munkholm ◽  
C. Thompson ◽  
C. M. Foster ◽  
J. A. Eastman ◽  
O. Auciello ◽  
...  
Keyword(s):  
Grazing Incidence ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Determination of the surface structure peculiarities of nanoscale metal particles via small-angle X-ray scattering

2016 ◽  
Vol 7 (5) ◽  
pp. 804-814 ◽  
Author(s):  
V. G. Dodonov ◽  
Yu. A. Zakharov ◽  
V. M. Pugachev ◽  
O. V. Vasiljeva
Keyword(s):  
Surface Structure ◽  
Small Angle ◽  
Metal Particles ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

X-RAY SCATTERING FROM SURFACES OF ORGANIC CRYSTALS

1997 ◽  
Vol 04 (04) ◽  
pp. 721-732 ◽  
Author(s):  
DAVID GIDALEVITZ ◽  
ROBERT FEIDENHANS'l ◽  
DETLEF M. SMILGIES ◽  
LESLIE LEISEROWITZ
Keyword(s):  
Surface Structure ◽  
Molecular Layering ◽  
Organic Crystals ◽  
X Ray ◽  
X Ray Scattering ◽  
Step Edges ◽  
Ray Scattering

X-ray scattering experiments have been performed on the surfaces of organic crystals. The (010) cleavage planes of β-alanine and α-glycine were investigated, and both specular and off-specular crystal truncation rods were measured. This allowed a determination of the molecular layering at the cleavage planes. Furthermore, the surfaces were investigated during growth and dissolution. No change in surface structure was observed, suggesting that the growth and dissolution is performed via the step edges. Finally, experiments on stereospecific adsorption of methionine on α-glycine were performed, showing that the (S)-methionine molecules are orderly attached to the [Formula: see text] surface of α-glycine and also attached to the (010) surface, but not in registry with the substrate.

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