Effects of conduction electron excitation on x-ray magnetic circularly polarized emission in itinerant ferromagnets

2020 ◽  
Vol 102 (22) ◽  
Author(s):  
Akihiro Koide ◽  
Takuji Nomura ◽  
Toshiya Inami
Keyword(s):  
Conduction Electron ◽  
Electron Excitation ◽  
Circularly Polarized ◽  
X Ray ◽  
Polarized Emission ◽  
Itinerant Ferromagnets

Bulk-sensitive magnetic microscope utilizing x-ray magnetic circularly polarized emission

2021 ◽  
Vol 130 (11) ◽  
pp. 113901
Author(s):  
Kento Sugawara ◽  
Toshiya Inami ◽  
Takahiro Nakada ◽  
Yui Sakaguchi ◽  
Shin Takahashi
Keyword(s):  
Circularly Polarized ◽  
X Ray ◽  
Polarized Emission

scholarly journals Publisher’s Note: “Bulk-sensitive magnetic microscope utilizing x-ray magnetic circularly polarized emission” [J. Appl. Phys. 130, 113901 (2021)]

2021 ◽  
Vol 130 (14) ◽  
pp. 149901
Author(s):  
Kento Sugawara ◽  
Toshiya Inami ◽  
Takahiro Nakada ◽  
Yui Sakaguchi ◽  
Shin Takahashi
Keyword(s):  
Circularly Polarized ◽  
X Ray ◽  
Polarized Emission

Influence of X-Ray Induced Fluorescence on Energy Dispersive X-Ray Analysis of Thin Foils

1977 ◽  
Vol 35 ◽  
pp. 328-329
Author(s):  
E. A. Kenik ◽  
J. Bentley
Keyword(s):  
Thin Foil ◽  
Electron Excitation ◽  
Simple Approach ◽  
Foil Thickness ◽  
X Rays ◽  
X Ray ◽  
Hole Spectrum ◽  
Illumination System ◽  
Thin Foils ◽  
Intensity Ratios

Cliff and Lorimer (1) have proposed a simple approach to thin foil x-ray analy sis based on the ratio of x-ray peak intensities. However, there are several experimental pitfalls which must be recognized in obtaining the desired x-ray intensities. Undesirable x-ray induced fluorescence of the specimen can result from various mechanisms and leads to x-ray intensities not characteristic of electron excitation and further results in incorrect intensity ratios.In measuring the x-ray intensity ratio for NiAl as a function of foil thickness, Zaluzec and Fraser (2) found the ratio was not constant for thicknesses where absorption could be neglected. They demonstrated that this effect originated from x-ray induced fluorescence by blocking the beam with lead foil. The primary x-rays arise in the illumination system and result in varying intensity ratios and a finite x-ray spectrum even when the specimen is not intercepting the electron beam, an ‘in-hole’ spectrum. We have developed a second technique for detecting x-ray induced fluorescence based on the magnitude of the ‘in-hole’ spectrum with different filament emission currents and condenser apertures.

EXELFS Studies of Carbon Fibers

1990 ◽  
Vol 48 (2) ◽  
pp. 72-73
Author(s):  
V. Serin ◽  
K. Hssein ◽  
G. Zanchi ◽  
J. Sévely
Keyword(s):  
Carbon Fibers ◽  
Energy Analysis ◽  
Electron Excitation ◽  
Complex Structures ◽  
High Modulus ◽  
Promising Technique ◽  
X Ray ◽  
Fine Structures ◽  
X Ray Absorption

The present developments of electron energy analysis in the microscopes by E.E.L.S. allow an accurate recording of the spectra and of their different complex structures associated with the inner shell electron excitation by the incident electrons (1). Among these structures, the Extended Energy Loss Fine Structures (EXELFS) are of particular interest. They are equivalent to the well known EXAFS oscillations in X-ray absorption spectroscopy. Due to the EELS characteristic, the Fourier analysis of EXELFS oscillations appears as a promising technique for the characterization of composite materials, the major constituents of which are low Z elements. Using EXELFS, we have developed a microstructural study of carbon fibers. This analysis concerns the carbon K edge, which appears in the spectra at 285 eV. The purpose of the paper is to compare the local short range order, determined by this way in the case of Courtauld HTS and P100 ex-polyacrylonitrile carbon fibers, which are high tensile strength (HTS) and high modulus (HM) fibers respectively.

In Situ Magnetic-Circular-X-Ray-Dichroism Measurements: An Epitaxial Fe Wedge on Cu(100)

MRS Bulletin ◽  
1999 ◽  
Vol 24 (1) ◽  
pp. 41-45 ◽  
Author(s):  
M.E. Dávila ◽  
D. Arvanitis ◽  
J. Hunter Dunn ◽  
N. Mårtensson ◽  
P. Srivastava ◽  
...  
Keyword(s):  
Ultrathin Films ◽  
Magnetic Circular Dichroism ◽  
Polarized Light ◽  
Measured Quantity ◽  
Easy Magnetization ◽  
Magnetization Direction ◽  
Core Electron ◽  
Circularly Polarized ◽  
X Ray

Circularly polarized x-ray radiation is attracting increasing interest as a tool for the characterization of the electronic, magnetic, and chiral properties of low-dimensional structures. Using circular light (with electric field vector parallel to the orbital plane), a dependence of the measured quantity by changing either the orientation of the light polarization or the magnetization is indicative of the existence of magnetic circular dichroism. It can be observed in x-ray absorption spectroscopy (XAS), in which the photon energy is scanned through an absorption threshold exciting a core electron into an unoccupied valence state using circularly polarized light. Synchrotron radiation sources have made this technique possible. It can also be observed in photo-emission spectroscopy from core and valence levels. Here we focus on magnetic circular x-ray dichroism (MCXD) in XAS as an element-specific tool to investigate magnetic properties of ultrathin films in situ. The application of magneto-optical sum rules enables the determination of the orbital and spin magnetic moments per atom from XAS spectra, as well as the easy magnetization direction.MCXD-based magnetometry in XAS is extensively used by measuring the L absorption edges of 3d-transition metals, where large intensity changes (up to 60%) of the L-edge white lines are observed upon reversal of either the sample magnetization or the light helicity. The high magnetic contrast obtained, combined with the elemental specificity of the technique, allows for the study of very dilute samples such as ultrathin films. We first concentrate on the selection rules governing MCXD in XAS.

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