Electronic and Chemical State of Aluminum from the Single- (K) and Double-Electron Excitation (KLII&III, KLI) X-ray Absorption Near-Edge Spectra of α-Alumina, Sodium Aluminate, Aqueous Al3+·(H2O)6, and Aqueous Al(OH)4–

2015 ◽  
Vol 119 (26) ◽  
pp. 8380-8388 ◽  
Author(s):  
John L. Fulton ◽  
Niranjan Govind ◽  
Thomas Huthwelker ◽  
Eric J. Bylaska ◽  
Aleksei Vjunov ◽  
...  
Author(s):  
V. Serin ◽  
K. Hssein ◽  
G. Zanchi ◽  
J. Sévely

The present developments of electron energy analysis in the microscopes by E.E.L.S. allow an accurate recording of the spectra and of their different complex structures associated with the inner shell electron excitation by the incident electrons (1). Among these structures, the Extended Energy Loss Fine Structures (EXELFS) are of particular interest. They are equivalent to the well known EXAFS oscillations in X-ray absorption spectroscopy. Due to the EELS characteristic, the Fourier analysis of EXELFS oscillations appears as a promising technique for the characterization of composite materials, the major constituents of which are low Z elements. Using EXELFS, we have developed a microstructural study of carbon fibers. This analysis concerns the carbon K edge, which appears in the spectra at 285 eV. The purpose of the paper is to compare the local short range order, determined by this way in the case of Courtauld HTS and P100 ex-polyacrylonitrile carbon fibers, which are high tensile strength (HTS) and high modulus (HM) fibers respectively.


2004 ◽  
Vol 108 (42) ◽  
pp. 16372-16376 ◽  
Author(s):  
Aline Léon ◽  
Oliver Kircher ◽  
Jörg Rothe ◽  
Maximilian Fichtner

2018 ◽  
Vol 24 (S1) ◽  
pp. 1008-1009
Author(s):  
Wenbing Yun ◽  
Srivatsan Seshadri ◽  
Sylvia Lewis ◽  
Jeff Gelb ◽  
SH Lau ◽  
...  

1998 ◽  
Vol 524 ◽  
Author(s):  
S. A. McHugo ◽  
A. C. Thompson ◽  
G. Lamble ◽  
A. MacDowell ◽  
R. Celestre ◽  
...  

ABSTRACTThe work presented here directly measures metal impurity distributions and their chemical state in as-grown and fully processed polycrystalline silicon used for terrestrial-based solar cells. The goal was to determine if a correlation exists between poorly performing regions of solar cells and metal impurity distributions as well as to ascertain the chemical state of the impurities. Synchrotron-based x-ray fluorescence mapping and x-ray absorption spectroscopy, both with a spatial resolution of lμm, were used to measure impurity distributions and chemical state, respectively, in poorly performing regions of polycrystalline silicon. The Light Beam Induced Current method was used to measure minority carrier recombination in the material in order to identify poor performance regions. We have detected iron, chromium, nickel, gold and copper impurity precipitates and we have recognized a direct correlation between impurity distributions and poor performing regions in both as-grown and fully processed material. Furthermore, from x-ray absorption studies, we have initial results, indicating that the Fe in this material is in oxide form, not FeSi2,. These results provide a fundamental understanding into the efficiency-limiting factors of polycrystalline silicon solar cells as well as yielding insight for methods of solar cell improvement.


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