scholarly journals High precision wavefront control in point spread function engineering for single emitter localization

2018 ◽  
Author(s):  
M. Siemons ◽  
C. N. Hulleman ◽  
R. Ø. Thorsen ◽  
C. S. Smith ◽  
S. Stallinga

AbstractPoint spread function (PSF) engineering is used in single emitter localization to measure the emitter position in 3D and possibly other parameters such as the emission color or dipole orientation as well. Advanced PSF models such as spline fits to experimental PSFs or the vectorial PSF model can be used in the corresponding localization algorithms in order to model the intricate spot shape and deformations correctly. The complexity of the optical architecture and fit model makes PSF engineering approaches particularly sensitive to optical aberrations. Here, we present a calibration and alignment protocol for fluorescence microscopes equipped with a spatial light modulator (SLM) with the goal of establishing a wavefront error well below the diffraction limit for optimum application of complex engineered PSFs. We achieve high-precision wavefront control, to a level below 20 mλ wavefront aberration over a 30 minute time window after the calibration procedure, using a separate light path for calibrating the pixel-to-pixel variations of the SLM, and alignment of the SLM with respect to the optical axis and Fourier plane within 3 µm (x/y) and 100 µm (z) error. Aberrations are retrieved from a fit of the vectorial PSF model to a bead z-stack and compensated with a residual wavefront error comparable to the error of the SLM calibration step. This well-calibrated and corrected setup makes it possible to create complex ‘3D+λ’ PSFs that fit very well to the vectorial PSF model. Proof-of-principle bead experiments show precisions below 10 nm in x, y, and λ, and below 20 nm in z over an axial range of 1 µm with 2000 signal photons and 12 background photons.

2018 ◽  
Vol 26 (7) ◽  
pp. 8397 ◽  
Author(s):  
M. Siemons ◽  
C. N. Hulleman ◽  
R. Ø. Thorsen ◽  
C. S. Smith ◽  
S. Stallinga

2019 ◽  
Vol 626 ◽  
pp. A55 ◽  
Author(s):  
G. B. Scharmer ◽  
M. G. Löfdahl ◽  
G. Sliepen ◽  
J. de la Cruz Rodríguez

We discuss the use of measurements of the solar granulation contrast as a measure of optical quality. We demonstrate that for data recorded with a telescope that uses adaptive optics and/or post-processing to compensate for many low- and high-order aberrations, the RMS granulation contrast is directly proportional to the Strehl ratio calculated from the residual (small-scale) wavefront error (static and/or from seeing). We demonstrate that the wings of the high-order compensated point spread function for the Swedish 1-m Solar Telescope (SST) are likely to extend to a radius of not more than about 2″, which is consistent with earlier conclusions drawn from stray-light compensation of sunspot images. We report on simultaneous measurements of seeing and solar granulation contrast averaged over 2 s time intervals at several wavelengths from 525 nm to 853.6 nm on the red-beam (CRISP beam) and wavelengths from 395 nm to 484 nm on the blue-beam (CHROMIS beam). These data were recorded with the SST, which has been revamped with an 85-electrode adaptive mirror and a new tip-tilt mirror, both of which were polished to exceptionally high optical quality. Compared to similar data obtained with the previous 37-electrode adaptive mirror in 2009 and 2011, there is a significant improvement in image contrast. The highest 2 s average image contrasts measured in April 2015 through 0.3−0.9 nm interference filters at 525 nm, 557 nm, 630 nm, and 853.5 nm with compensation only for the diffraction limited point spread function of SST are 11.8%, 11.8%, 10.2%, and 7.2%, respectively. Similarly, the highest 2 s contrasts measured at 395 nm, 400 nm, and 484 nm in May 2016 through 0.37−1.3 nm filters are 16%, 16%, and 12.5%, respectively. The granulation contrast observed with SST compares favorably to measured values with SOT on Hinode and with Sunrise as well as major ground-based solar telescopes. Simultaneously with the above wideband red-beam data, we also recorded narrowband continuum images with the CRISP imaging spectropolarimeter. We find that contrasts measured with CRISP are entirely consistent with the corresponding wideband contrasts, demonstrating that any additional image degradation by the CRISP etalons and telecentric optical system is marginal or even insignificant. Finally, we discuss the origin of the 48 nm RMS wavefront error needed to bring consistency between the measured granulation contrast and that obtained from 3D simulations of convection.


Author(s):  
Yoav Shechtman ◽  
Steffen J. Sahl ◽  
Lucien E. Weiss ◽  
Adam S. Backer ◽  
W. E. Moerner

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