scholarly journals High precision wavefront control in point spread function engineering for single emitter localization

2018 ◽  
Vol 26 (7) ◽  
pp. 8397 ◽  
Author(s):  
M. Siemons ◽  
C. N. Hulleman ◽  
R. Ø. Thorsen ◽  
C. S. Smith ◽  
S. Stallinga
Keyword(s):  
High Precision ◽  
Point Spread Function ◽  
Wavefront Control ◽  
Point Spread ◽  
Spread Function ◽  
Point Spread Function Engineering ◽  
Single Emitter ◽  
Emitter Localization

scholarly journals High precision wavefront control in point spread function engineering for single emitter localization

2018 ◽  
Author(s):  
M. Siemons ◽  
C. N. Hulleman ◽  
R. Ø. Thorsen ◽  
C. S. Smith ◽  
S. Stallinga
Keyword(s):  
High Precision ◽  
Point Spread Function ◽  
Time Window ◽  
Wavefront Aberration ◽  
Wavefront Control ◽  
Point Spread ◽  
Spread Function ◽  
Wavefront Error ◽  
Single Emitter ◽  
Emitter Localization

AbstractPoint spread function (PSF) engineering is used in single emitter localization to measure the emitter position in 3D and possibly other parameters such as the emission color or dipole orientation as well. Advanced PSF models such as spline fits to experimental PSFs or the vectorial PSF model can be used in the corresponding localization algorithms in order to model the intricate spot shape and deformations correctly. The complexity of the optical architecture and fit model makes PSF engineering approaches particularly sensitive to optical aberrations. Here, we present a calibration and alignment protocol for fluorescence microscopes equipped with a spatial light modulator (SLM) with the goal of establishing a wavefront error well below the diffraction limit for optimum application of complex engineered PSFs. We achieve high-precision wavefront control, to a level below 20 mλ wavefront aberration over a 30 minute time window after the calibration procedure, using a separate light path for calibrating the pixel-to-pixel variations of the SLM, and alignment of the SLM with respect to the optical axis and Fourier plane within 3 µm (x/y) and 100 µm (z) error. Aberrations are retrieved from a fit of the vectorial PSF model to a bead z-stack and compensated with a residual wavefront error comparable to the error of the SLM calibration step. This well-calibrated and corrected setup makes it possible to create complex ‘3D+λ’ PSFs that fit very well to the vectorial PSF model. Proof-of-principle bead experiments show precisions below 10 nm in x, y, and λ, and below 20 nm in z over an axial range of 1 µm with 2000 signal photons and 12 background photons.

scholarly journals High-fidelity structured illumination microscopy by point-spread-function engineering

2021 ◽  
Vol 10 (1) ◽  
Author(s):  
Gang Wen ◽  
Simin Li ◽  
Linbo Wang ◽  
Xiaohu Chen ◽  
Zhenglong Sun ◽  
...  
Keyword(s):  
Point Spread Function ◽  
Super Resolution ◽  
Reconstruction Algorithm ◽  
High Fidelity ◽  
Structured Illumination ◽  
Structured Illumination Microscopy ◽  
Imaging Tool ◽  
Point Spread ◽  
Spread Function ◽  
Point Spread Function Engineering

AbstractStructured illumination microscopy (SIM) has become a widely used tool for insight into biomedical challenges due to its rapid, long-term, and super-resolution (SR) imaging. However, artifacts that often appear in SIM images have long brought into question its fidelity, and might cause misinterpretation of biological structures. We present HiFi-SIM, a high-fidelity SIM reconstruction algorithm, by engineering the effective point spread function (PSF) into an ideal form. HiFi-SIM can effectively reduce commonly seen artifacts without loss of fine structures and improve the axial sectioning for samples with strong background. In particular, HiFi-SIM is not sensitive to the commonly used PSF and reconstruction parameters; hence, it lowers the requirements for dedicated PSF calibration and complicated parameter adjustment, thus promoting SIM as a daily imaging tool.

Point spread function engineering with multiphoton SPIFI

2016 ◽  
Author(s):  
Keith A. Wernsing ◽  
Jeffrey J. Field ◽  
Scott R. Domingue ◽  
Alyssa M. Allende-Motz ◽  
Keith F. DeLuca ◽  
...  
Keyword(s):  
Point Spread Function ◽  
Point Spread ◽  
Spread Function ◽  
Point Spread Function Engineering

scholarly journals Fourier optics approach to imaging with sub-wavelength resolution through metal-dielectric multilayers

2010 ◽  
Vol 18 (4) ◽  
Author(s):  
R. Kotyński
Keyword(s):  
Point Spread Function ◽  
Imaging System ◽  
Diffraction Theory ◽  
Spatial Filter ◽  
Fourier Optics ◽  
Point Spread ◽  
Spread Function ◽  
Point Spread Function Engineering ◽  
Wavelength Resolution ◽  
Sub Wavelength

AbstractMetal-dielectric layered stacks for imaging with sub-wavelength resolution are regarded as linear isoplanatic systems — a concept popular in Fourier optics and in scalar diffraction theory. In this context, a layered flat lens is a one-dimensional spatial filter characterised by the point spread function. However, depending on the model of the source, the definition of the point spread function for multilayers with sub-wavelength resolution may be formulated in several ways. Here, a distinction is made between a soft source and hard electric or magnetic sources. Each of these definitions leads to a different meaning of perfect imaging. It is shown that some simple interpretations of the PSF, such as the relation of its width to the resolution of the imaging system are ambiguous for the multilayers with sub-wavelenth resolution. These differences must be observed in point spread function engineering of layered systems with sub-wavelength sized PSF.

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