scholarly journals Toward High‐Precision Astrometry with WFPC2. I. Deriving an Accurate Point‐Spread Function

2000 ◽  
Vol 112 (776) ◽  
pp. 1360-1382 ◽  
Author(s):  
Jay Anderson ◽  
Ivan R. King
Keyword(s):  
High Precision ◽  
Point Spread Function ◽  
Point Spread ◽  
Spread Function ◽  
Precision Astrometry

scholarly journals High precision wavefront control in point spread function engineering for single emitter localization

2018 ◽  
Vol 26 (7) ◽  
pp. 8397 ◽  
Author(s):  
M. Siemons ◽  
C. N. Hulleman ◽  
R. Ø. Thorsen ◽  
C. S. Smith ◽  
S. Stallinga
Keyword(s):  
High Precision ◽  
Point Spread Function ◽  
Wavefront Control ◽  
Point Spread ◽  
Spread Function ◽  
Point Spread Function Engineering ◽  
Single Emitter ◽  
Emitter Localization

scholarly journals High precision wavefront control in point spread function engineering for single emitter localization

2018 ◽  
Author(s):  
M. Siemons ◽  
C. N. Hulleman ◽  
R. Ø. Thorsen ◽  
C. S. Smith ◽  
S. Stallinga
Keyword(s):  
High Precision ◽  
Point Spread Function ◽  
Time Window ◽  
Wavefront Aberration ◽  
Wavefront Control ◽  
Point Spread ◽  
Spread Function ◽  
Wavefront Error ◽  
Single Emitter ◽  
Emitter Localization

AbstractPoint spread function (PSF) engineering is used in single emitter localization to measure the emitter position in 3D and possibly other parameters such as the emission color or dipole orientation as well. Advanced PSF models such as spline fits to experimental PSFs or the vectorial PSF model can be used in the corresponding localization algorithms in order to model the intricate spot shape and deformations correctly. The complexity of the optical architecture and fit model makes PSF engineering approaches particularly sensitive to optical aberrations. Here, we present a calibration and alignment protocol for fluorescence microscopes equipped with a spatial light modulator (SLM) with the goal of establishing a wavefront error well below the diffraction limit for optimum application of complex engineered PSFs. We achieve high-precision wavefront control, to a level below 20 mλ wavefront aberration over a 30 minute time window after the calibration procedure, using a separate light path for calibrating the pixel-to-pixel variations of the SLM, and alignment of the SLM with respect to the optical axis and Fourier plane within 3 µm (x/y) and 100 µm (z) error. Aberrations are retrieved from a fit of the vectorial PSF model to a bead z-stack and compensated with a residual wavefront error comparable to the error of the SLM calibration step. This well-calibrated and corrected setup makes it possible to create complex ‘3D+λ’ PSFs that fit very well to the vectorial PSF model. Proof-of-principle bead experiments show precisions below 10 nm in x, y, and λ, and below 20 nm in z over an axial range of 1 µm with 2000 signal photons and 12 background photons.

Optimal Point Spread Function for 3D High-Precision Imaging

2015 ◽  
Author(s):  
Yoav Shechtman ◽  
Steffen J. Sahl ◽  
Lucien E. Weiss ◽  
Adam S. Backer ◽  
W. E. Moerner
Keyword(s):  
High Precision ◽  
Point Spread Function ◽  
Optimal Point ◽  
Point Spread ◽  
Spread Function
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