scholarly journals Nanowire systems: technology and design

Author(s):  
Pierre-Emmanuel Gaillardon ◽  
Luca Gaetano Amarù ◽  
Shashikanth Bobba ◽  
Michele De Marchi ◽  
Davide Sacchetto ◽  
...  

Nanosystems are large-scale integrated systems exploiting nanoelectronic devices. In this study, we consider double independent gate, vertically stacked nanowire field effect transistors (FETs) with gate-all-around structures and typical diameter of 20 nm. These devices, which we have successfully fabricated and evaluated, control the ambipolar behaviour of the nanostructure by selectively enabling one type of carriers. These transistors work as switches with electrically programmable polarity and thus realize an exclusive or operation. The intrinsic higher expressive power of these FETs, when compared with standard complementary metal oxide semiconductor technology, enables us to realize more efficient logic gates, which we organize as tiles to realize nanowire systems by regular arrays. This article surveys both the technology for double independent gate FETs as well as physical and logic design tools to realize digital systems with this fabrication technology.

2015 ◽  
Vol 24 (03n04) ◽  
pp. 1550008 ◽  
Author(s):  
Bander Saman ◽  
P. Mirdha ◽  
M. Lingalugari ◽  
P. Gogna ◽  
F. C. Jain ◽  
...  

This paper presents the design and modeling of logic gates using two channel spatial wavefunction switched field-effect transistors (SWSFETs) it is also known as a twin-drain MOSFET. In SWSFETs, the channel between source and drain has two or more quantum wells (QWs) layers separated by a high band gap material between them. The gate voltage controls the charge carrier concentration in the two quantum wells layers and it causes the switching of charge carriers from one channel to other channel of the device. The first part of this paper shows the characteristics of n-channel SWSFET model, the second part provides the circuit topology for the SWSFET inverter and universal gates- NAND, AND, NOR,OR, XOR and XOR. The proposed model is based on integration between Berkeley Short-channel IGFET Model (BSIM) and Analog Behavioral Model (ABM), the model is suitable to investigate the gates configuration and transient analysis at circuit level. The results show that all basic two-input logic gates can be implanted by using n-channel SWSFET only, It covers less area compared with CMOS (Complementary metal–oxide–semiconductor) gates. The NAND-NOR can be performed by three SWSFET, moreover the exclusive-NOR “XNOR” can be done by four SWSFET transistors also AND, OR, XOR gates require two additional SWSFET for inverting.


2018 ◽  
Vol 7 (2.7) ◽  
pp. 647
Author(s):  
J Lakshmi Prasanna ◽  
V Sahiti ◽  
E Raghuveera ◽  
M Ravi Kumar

A 128-Bit Digital Comparator is designed with Digital Complementary Metal Oxide Semiconductor (CMOS) logic, with the use of Parallel Prefix Tree Structure [1] technique. The comparison is performed on Most Significant Bit (MSB) to the Least Significant Bit (LSB). The comparison for the lower order bits carried out only when the MSBs are equal. This technique results in Optimized Power consumption and improved speed of operation. To make the circuit regular, the design is made using only CMOS logic gates. Transmission gates were used in the existing design and are replaced with the simple AND gates. This 128-Bit comparator is designed using Cadence TSMC 0.18µm technology and optimized the Power dissipation to 0.28mW and with a Delay of 0.87μs. 


2018 ◽  
Vol 17 (1) ◽  
Author(s):  
Md Ibnul Bin Kader Arnub ◽  
M Tanseer Ali

The double gate MOSFET, where two gates are fabricated along the length of the channel one after another. Design of logic gates is one of the most eminent application of Double Gate MOSFET. Gallium nitride (GaN) based metal-oxide semiconductor field-effect transistors (MOSFETs) are shown to be promising for digital logic applications. This paper describes the design and analysis of different types of logic gates using GaN based DG-MOSFET. The gate length (LG) is kept constant at 10.6 nm. The gate voltage varies from 0 to 1 V for the device switching from turn OFF to turn ON-state. For the device with HfO2 as gate oxide, the ON-state current (ION) and OFF-state current (IOFF) are found 8.11×10-3 and 6.38605×10-9A/μm respectively. The leakage current is low for the device with HfO2 as compared to that for the device with ZrO2. The subthreshold swing (SS) is 68.7408 mV/dec for the device with HfO2.


2020 ◽  
Author(s):  
Akshay Wali ◽  
Andrew Arnold ◽  
Shamik Kundu ◽  
Soumyadeep Choudhury ◽  
Kanad Basu ◽  
...  

Abstract Reverse engineering (RE) is one of the major security threats to the semiconductor industry due to the involvement of untrustworthy parties in an increasingly globalized chip manufacturing supply chain [1-5]. RE efforts have already been successful in extracting device level functionalities from an integrated circuit (IC) with very limited resources [6]. Camouflaging is an obfuscation method that can thwart such RE [7-9]. Existing work on IC camouflaging primarily uses fabrication techniques such as doping and dummy contacts to hide the circuit structure or build cells that look alike but have different functionalities. While promising these Si complementary metal oxide semiconductor (CMOS) based obfuscation techniques adds significant area overhead and are successfully decamouflaged by the Satisfiability solver (SAT)-based reverse engineering techniques [9-13]. Emerging solutions, such as polymorphic gates based on giant spin Hall effect (GSHE) are promising but adds delay overhead in hybrid CMOS-GSHE designs restricting the camouflaging to a maximum of 15% of all the gates in the circuit. Here, we harness the unique properties of two-dimensional (2D) transition metal dichalcogenides (TMDs) including MoS2, MoSe2, MoTe2, WS2, and WSe2 and their optically transparent transition metal oxides (TMOs) to demonstrate novel area efficient camouflaging solutions that are resilient to SAT-attack and automatic test pattern generation (ATPG) attacks. We show that resistors with resistance values differing by 8 orders of magnitude, diodes with variable turn-on voltages and reverse saturation currents, and field effect transistors (FETs) with adjustable conduction type, threshold voltages and switching characteristics can be optically camouflaged to look exactly similar by engineering TMO/TMD heterostructures allowing hardware obfuscation of both digital and analog circuits. Since this 2D heterostructure devices family is intrinsically camouflaged, NAND/NOR/AND/OR gates in the circuit can be obfuscated with significantly less area overhead allowing 100% logic obfuscation compared to only 5% for CMOS-based camouflaging. Finally, we demonstrate that the largest benchmarking circuit from ISCAS’85, comprised of more than 4000 logic gates when obfuscated with the CMOS-based technique are successfully decamouflaged by SAT-attack in less than 40 minutes; whereas, it renders to be invulnerable even in more than 10 hours, when camouflaged with 2D heterostructure devices thereby corroborating our hypothesis of high resilience against RE. Our approach of connecting unique material properties to innovative devices to secure circuits can be considered as one of its kind demonstrations, highlighting the benefits of cross-layer optimization.


MRS Bulletin ◽  
1996 ◽  
Vol 21 (4) ◽  
pp. 38-44 ◽  
Author(s):  
F.K. LeGoues

Recently much interest has been devoted to Si-based heteroepitaxy, and in particular, to the SiGe/Si system. This is mostly for economical reasons: Si-based technology is much more advanced, is widely available, and is cheaper than GaAs-based technology. SiGe opens the door to the exciting (and lucrative) area of Si-based high-performance devices, although optical applications are still limited to GaAs-based technology. Strained SiGe layers form the base of heterojunction bipolar transistors (HBTs), which are currently used in commercial high-speed analogue applications. They promise to be low-cost compared to their GaAs counterparts and give comparable performance in the 2-20-GHz regime. More recently we have started to investigate the use of relaxed SiGe layers, which opens the door to a wider range of application and to the use of SiGe in complementary metal oxide semiconductor (CMOS) devices, which comprise strained Si and SiGe layers. Some recent successes include record-breaking low-temperature electron mobility in modulation-doped layers where the mobility was found to be up to 50 times better than standard Si-based metal-oxide-semiconductor field-effect transistors (MOSFETs). Even more recently, SiGe-basedp-type MOSFETS were built with oscillation frequency of up to 50 GHz, which is a new record, in anyp-type material for the same design rule.


2021 ◽  
Author(s):  
Pin Tian ◽  
Hongbo Wu ◽  
Libin Tang ◽  
Jinzhong Xiang ◽  
Rongbin Ji ◽  
...  

Abstract Two-dimensional (2D) materials exhibit many unique optical and electronic properties that are highly desirable for application in optoelectronics. Here, we report the study of photodetector based on 2D Bi2O2Te grown on n-Si substrate. The 2D Bi2O2Te material was transformed from sputtered Bi2Te3 ultrathin film after rapid annealing at 400 ℃ for 10 min in air atmosphere. The photodetector was capable of detecting a broad wavelength from 210 nm to 2.4 μm with excellent responsivity of up to 3x105 and 2x104 AW-1, and detectivity of 4x1015 and 2x1014 Jones at deep ultraviolet (UV) and short-wave infrared (SWIR) under weak light illumination, respectively. The effectiveness of 2D materials in weak light detection was investigated by analysis of the photocurrent density contribution. Importantly, the facile growth process with low annealing temperature would allow direct large-scale integration of the 2D Bi2O2Te materials with complementary metal-oxide–semiconductor (CMOS) technology.


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