Organics at surfaces, their detection and analysis by static secondary ion mass spectrometry

The analysis of the surface chemistry of organic materials or of organic molecules at surfaces presents special problems. Firstly there is the requirement of high chemical specificity and the ability to detect small differences in chemical state. Secondly, organics are very sensitive to damage by the radiation used for the analysis. Over recent years, static secondary ion mass spectrometry (SSIMS) has been developed into a technique which is able to provide the power of mass spectrometry for the chemical characterization of surfaces. Furthermore, the advent of time-of-flight mass spectrometry techniques has enabled very high sensitivity with little sample damage. The power of the technique is illustrated by its application to four areas of surface investigation: the adsorption and reaction of propene at a ruthenium single crystal surface; the interaction of organic lubricants at a synthetic ‘gold’ surface; the interaction of bioactive molecules at a model cell membrane surface, and the identification of contamination responsible for adhesive failure.

1990 ◽  
Vol 200 ◽  
pp. 47-57 ◽  
Author(s):  
Alexander M. Lawson ◽  
Wengang Chai ◽  
Geoffrey C. Cashmore ◽  
Mark S. Stoll ◽  
Elizabeth F. Hounsell ◽  
...  

1985 ◽  
Vol 21 (1-4) ◽  
pp. 168-198 ◽  
Author(s):  
Richard J. Colton ◽  
Joseph E. Campana ◽  
David A. Kidwell ◽  
Mark M. Ross ◽  
Jeffrey R. Wyatt

2018 ◽  
Vol 33 (9) ◽  
pp. 1559-1563 ◽  
Author(s):  
Wanfeng Zhang ◽  
Xiaoping Xia ◽  
Yanqiang Zhang ◽  
Touping Peng ◽  
Qing Yang

Secondary ion mass spectrometry (SIMS) has been applied to analyze a wide range of materials for earth science research due to its high sensitivity, high precision and capacity for in situ micro-analysis.


Sign in / Sign up

Export Citation Format

Share Document