A novel sample preparation method for ultra-high vacuum (UHV) secondary ion mass spectrometry (SIMS) analysis
2018 ◽
Vol 33
(9)
◽
pp. 1559-1563
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Keyword(s):
Secondary ion mass spectrometry (SIMS) has been applied to analyze a wide range of materials for earth science research due to its high sensitivity, high precision and capacity for in situ micro-analysis.
1972 ◽
Vol 9
(1)
◽
pp. 482-486
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2019 ◽
Vol 47
(12)
◽
pp. 1887-1892
2008 ◽
Vol 23
(2)
◽
pp. 353-358
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Philosophical Transactions of the Royal Society of London Series A Physical and Engineering Sciences
◽
1990 ◽
Vol 333
(1628)
◽
pp. 147-158
◽
1991 ◽
Vol 20
(4)
◽
pp. 169-178
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2020 ◽