Thin-Gate Front Side–illuminated versus Back Side–illuminated Charge-coupled Devices for X-Ray Astronomy

1996 ◽  
Vol 466 (1) ◽  
pp. L51-L54 ◽  
Author(s):  
R. P. Kraft ◽  
D. N. Burrows ◽  
G. P. Garmire ◽  
J. A. Nousek
2013 ◽  
Vol 2013 ◽  
pp. 1-5 ◽  
Author(s):  
C. Marutoiu ◽  
S. P. Grapini ◽  
A. Baciu ◽  
M. Miclaus ◽  
V. C. Marutoiu ◽  
...  

The Evangelic Church in Bistriţa city is one of the important gothic monuments in Romania. Inside the church there have been preserved a series of furniture pieces from different centuries, and the stall that has been analysed in this study is one of them. The study presents the investigations that were made on the occasion of restoring the stall. The nature and the status of the wooden supports and also the composition of the painting layer which covers the front side of the stall were investigated by several methods: Fourier transform infrared (FTIR) spectroscopy, X-ray diffraction (XRD), and differential scanning calorimetry (DSC) analyses. The back side of the stall was made of spruce fir wood and its status was also investigated. The nature of the component elements and the heritage value of the ensemble were also established.


2014 ◽  
Vol 2014 (1) ◽  
pp. 000382-000387 ◽  
Author(s):  
Kenichi Mori ◽  
Naoyuki Koizumi ◽  
Kei Murayama ◽  
Mitsuhiro Aizawa ◽  
Koji Nagai ◽  
...  

This paper describes the development of a Glass-Interposer (Glass-IP) with 40um-pitch Cu micro- bumps. It features fine Cu wiring on the front side, Through-hole Glass-Vias (TGV), and a Re-distribution layer (RDL) on back side. After first explaining our process flow, we discuss the warpage of the fully assembled Glass-IP. The focus was on the CTE differences between the Glass-IP and the laminated substrate. The result was the lower CTE of the laminated substrate gave the assembly a lower warpage, while the CTE of Glass-IP had hardly any influence at all. Furthermore, we evaluated two assembly processes for the Glass-IP. One is called “Chip First Process” in which the chips are mounted on Glass-IP first. The other is called “Chip Last Process” where the Glass-IP is mounted on the laminated substrate first. It was confirmed by X-ray observation that the connectivity after full assembly is good for both processes.


2014 ◽  
Vol 16 (27) ◽  
pp. 13748-13754 ◽  
Author(s):  
Hiromitsu Uehara ◽  
Yohei Uemura ◽  
Takafumi Ogawa ◽  
Kentaro Kono ◽  
Ryoichi Ueno ◽  
...  

We measured the in situ polarization-dependent X-ray absorption fine structure of PtNPs deposited on a flat HOPG substrate.


1975 ◽  
Vol 19 ◽  
pp. 339-353
Author(s):  
R. E. Van Grieken ◽  
F. C. Adams

In the case of X-ray fluorescence analysis of aerosol loaded filters, the X-ray absorption effect Is due to particulate matter absorption and to filter material absorption. The latter contribution is of a predominant importance in many practical cases. It can be calculated from the ratio of the X-ray intensities measured from the front and back side of the filters. The sandwich geometry obtained by folding the filters in two with the loaded side inwards during the measurement renders the filter material absorption correction much simpler and often more accurate, and offers distinct additional advantages.


2007 ◽  
Vol 1012 ◽  
Author(s):  
Jie Zhou ◽  
Xuanzhi Wu ◽  
Yanfa Yan ◽  
Sally Asher ◽  
Juarez Da Silva ◽  
...  

AbstractThe “roll-over” phenomenon in current-voltage (J-V) curves of CdS/CdTe devices is recognized as a result of the formation of a higher back barrier. When Cu has not been intentionally added to the back contact, roll-over is understandable. However, the mechanism was unclear for forming J-V roll-over in a CdTe cell with a back contact containing Cu. We did extensive characterizations, including XRD, XPS, SIMS, TEM, and EDS, and “recontact” experiments to understand this phenomenon. The results show that the roll-over comes from the formation of Cu-related oxides at the back side of the device during processing, rather than the diffusion of Cu to the front side of the device. Discussions related to the J-V roll-over mechanisms will also be presented.


1997 ◽  
Vol 68 (1) ◽  
pp. 47-54 ◽  
Author(s):  
Mark W. Tate ◽  
Sol M. Gruner ◽  
Eric F. Eikenberry
Keyword(s):  
X Ray ◽  

1996 ◽  
Vol 43 (6) ◽  
pp. 2998-3004 ◽  
Author(s):  
A. Holmes-Siedle ◽  
A. Holland ◽  
S. Watts

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