A Recalibration of the Diffraction Efficiency of the Transmission Grating Spectrometers onEXOSAT

1998 ◽  
Vol 496 (1) ◽  
pp. 473-483 ◽  
Author(s):  
Frits Paerels ◽  
Steven M. Kahn ◽  
Debra N. Wolkovitch
Keyword(s):  
Diffraction Efficiency ◽  
Transmission Grating

scholarly journals Experimental calibration of transmission grating and theoretical calculation of diffraction efficiency

2011 ◽  
Vol 60 (3) ◽  
pp. 034216
Author(s):  
Zhao Yi-Dong ◽  
Cui Ming-Qi ◽  
Zheng Lei ◽  
Han Yong ◽  
Zhou Ke-Jin ◽  
...  
Keyword(s):  
Theoretical Calculation ◽  
Diffraction Efficiency ◽  
Experimental Calibration ◽  
Transmission Grating

scholarly journals General model of transmission grating diffraction efficiency

2011 ◽  
Vol 60 (9) ◽  
pp. 094212
Author(s):  
Shang Wan-Li ◽  
Yang Jia-Min ◽  
Zhao Yang ◽  
Zhu Tuo ◽  
Xiong Gang
Keyword(s):  
Diffraction Efficiency ◽  
General Model ◽  
Transmission Grating ◽  
Grating Diffraction

Investigation into the Design and Diffraction Efficiency of Shifted Dual Transmission Grating

2015 ◽  
Vol 44 (10) ◽  
pp. 1030003
Author(s):  
王保清 WANG Bao-qing ◽  
王传珂 WANG Chuan-ke ◽  
易涛 YI Tao ◽  
李廷帅 LI Ting-shuai ◽  
李晋 LI Jin ◽  
...  
Keyword(s):  
Diffraction Efficiency ◽  
Transmission Grating ◽  
Dual Transmission

Calibration method of transmission grating diffraction efficiency with weak high-order harmonics

2014 ◽  
Vol 26 (1) ◽  
pp. 12008
Author(s):  
朱托 Zhu Tuo ◽  
尚万里 Shang Wanli ◽  
杨家敏 Yang Jiamin ◽  
熊刚 Xiong Gang ◽  
赵阳 Zhao Yang ◽  
...  
Keyword(s):  
Diffraction Efficiency ◽  
Calibration Method ◽  
High Order ◽  
Transmission Grating ◽  
Grating Diffraction

scholarly journals Investigation into the design and diffraction efficiency of shifted dual transmission grating

2016 ◽  
Vol 65 (16) ◽  
pp. 165201
Author(s):  
Yi Tao ◽  
Wang Chuan-Ke ◽  
Yang Jin-Wen ◽  
Zhu Xiao-Li ◽  
Xie Chang-Qing ◽  
...  
Keyword(s):  
Diffraction Efficiency ◽  
Transmission Grating ◽  
Dual Transmission

scholarly journals HOLOGRAPHIC RECORDING IN CORONA CHARGED ACRYLAMIDE-BASED MFI-ZEOLITE PHOTOPOLYMER

2011 ◽  
Vol 20 (03) ◽  
pp. 271-279 ◽  
Author(s):  
T. YOVCHEVA ◽  
I. NAYDENOVA ◽  
S. SAINOV ◽  
V. TOAL ◽  
S. MINTOVA
Keyword(s):  
Diffraction Efficiency ◽  
Total Internal Reflection ◽  
Internal Reflection ◽  
Holographic Recording ◽  
Mfi Zeolite ◽  
Transmission Grating ◽  
Recording Process ◽  
Transmission Geometry ◽  
Corona Charging ◽  
Reflection Grating

The influence of corona charging on holographic recording in acrylamide-based photopolymer nanocomposite containing MFI zeolite nanoparticles has been studied. The holographic recording was carried out in two different geometries — transmission grating recording and total internal reflection grating recording. During the recording process, the layers were charged in a corona field. It was observed that independently of the corona polarity, in the case of transmission geometry of recording, the corona charging led to a decrease in the diffraction efficiency (DE) of the grating. In the case of the total internal reflection grating, the DE increased in the corona field presence.

Microlithography for the AXAF-I High Energy Transmission Grating Spectrometer

1993 ◽  
Author(s):  
Michael McGuirk ◽  
Richard Aucoin ◽  
Mark Schattenberg ◽  
Robert Fleming ◽  
Henry Smith
Keyword(s):  
High Energy ◽  
Energy Transmission ◽  
Transmission Grating ◽  
Grating Spectrometer

Introduction of Spectral Mapping through Transmission Grating, Derivative Technique of Photon Emission

2014 ◽  
Author(s):  
Thierry Parrassin ◽  
Sylvain Dudit ◽  
Michel Vallet ◽  
Antoine Reverdy ◽  
Hervé Deslandes
Keyword(s):  
Integrated Circuits ◽  
Failure Analysis ◽  
Light Emission ◽  
Photon Emission ◽  
Optical Path ◽  
Spectral Mapping ◽  
Additional Information ◽  
Transmission Grating ◽  
Emission System ◽  
Advance Knowledge

Abstract By adding a transmission grating into the optical path of our photon emission system and after calibration, we have completed several failure analysis case studies. In some cases, additional information on the emission sites is provided, as well as understanding of the behavior of transistors that are associated to the fail site. The main application of the setup is used for finding and differentiating easily related emission spots without advance knowledge in light emission mechanisms in integrated circuits.

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