Design of a calorimeter for near-field heat transfer measurements and thermal scanning probe microscopy

AbstractTypical measurements of light in the near-field utilize a photodetector such as a photomultiplier tube or a photodiode, which is placed remotely from the region under test. This kind of detection has many draw-backs including the necessity to detect light in the far-field, the influence of background propagating radiation, the relatively narrowband operation of photodetectors which complicates the operation over a wide wavelength range, and the difficulty in detecting radiation in the far-IR and THz. Here we review an alternative near-field light measurement technique based on the detection of optically induced forces acting on the scanning probe. This type of detection overcomes some of the above limitations, permitting true broad-band detection of light directly in the near-field with a single detector. The physical origins and the main characteristics of optical force detection are reviewed. In addition, intrinsic effects of the inherent optical forces for certain operation modalities of scanning probe microscopy are discussed. Finally, we review practical applications of optical force detection of interest for the broader field of the scanning probe microscopy.

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Scanning Probe Microscopy: Present Status and New Development. Basic Performance of Near-Field Optical Microscope and Its Applications.

Hyomen Kagaku ◽

10.1380/jsssj.20.344 ◽

1999 ◽

Vol 20 (5) ◽

pp. 344-351

Author(s):

Toshiharu SAIKI

Keyword(s):

Scanning Probe Microscopy ◽

Present Status ◽

Near Field ◽

Optical Microscope ◽

Scanning Probe ◽

Probe Microscopy ◽

New Development ◽

Basic Performance

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Near field imaging of a semiconductor laser by scanning probe microscopy without a photodetector

Applied Physics Letters ◽

10.1063/1.4817677 ◽

2013 ◽

Vol 103 (5) ◽

pp. 053120 ◽

Cited By ~ 13

Author(s):

M. S. Dunaevskiy ◽

P. A. Alekseev ◽

A. N. Baranov ◽

A. M. Monakhov ◽

R. Teissier ◽

...

Keyword(s):

Semiconductor Laser ◽

Scanning Probe Microscopy ◽

Near Field ◽

Scanning Probe ◽

Probe Microscopy ◽

Near Field Imaging ◽

Field Imaging

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Disentangling time in a near-field approach to scanning probe microscopy

Nanoscale ◽

10.1039/c1nr10491h ◽

2011 ◽

Vol 3 (9) ◽

pp. 3589 ◽

Cited By ~ 34

Author(s):

Marco Farina ◽

Agnese Lucesoli ◽

Tiziana Pietrangelo ◽

Andrea di Donato ◽

Silvia Fabiani ◽

...

Keyword(s):

Scanning Probe Microscopy ◽

Near Field ◽

Scanning Probe ◽

Probe Microscopy ◽

Field Approach

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Optical near-field excitation at commercial scanning probe microscopy tips: a theoretical and experimental investigation

Physical Chemistry Chemical Physics ◽

10.1039/c3cp51730f ◽

2014 ◽

Vol 16 (6) ◽

pp. 2289-2296 ◽

Cited By ~ 31

Author(s):

Christoph Huber ◽

Andreas Trügler ◽

Ulrich Hohenester ◽

Yehiam Prior ◽

Wolfgang Kautek

Keyword(s):

Experimental Investigation ◽

Scanning Probe Microscopy ◽

Near Field ◽

Scanning Probe ◽

Probe Microscopy ◽

Field Excitation

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Mapping viscoelasticity, (specific) adhesion and near-field fluorescence of cellular structures with scanning probe microscopy

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100139974 ◽

1995 ◽

Vol 53 ◽

pp. 720-721

Author(s):

B.G. de Grooth ◽

N.F. van Hulst ◽

J. Greve ◽

C.E.H. Berger ◽

M.H.P. Moers ◽

...

Keyword(s):

Scanning Probe Microscopy ◽

Near Field ◽

Operation Mode ◽

Scanning Probe ◽

Normal Operation ◽

Probe Microscopy ◽

Atomic Force ◽

Standard Operation ◽

High Resolution Images ◽

Tapping Mode Afm

One of the major features of scanning probe microscopy is the ability to produce high-resolution images in air and in liquid. This makes these microscopes potentially very useful for the study of biological materials. Indeed the number of reports that use these microscopes, especially the atomic force microscope (AFM), has increased exponentially in the past decade. However, in order to become a routine apparatus that is able to image live processes at a scale of a few nanometers, the instrumentation of the AFM has to be improved. First of all, under normal operation, the movement of the tip across the surface of fragile biological structures such as cell membranes, often results in movement or even destruction of the object. Secondly, the lack of specificity of the AFM makes it difficult to identify the observed structures. Other problems include the low imaging speed and problems associated with the tip-sample convolution. Here we will report on attempts to improve the first two points: sample destruction and specificity.It has become clear recently that for operation in air the so-called tapping mode AFM is much more gentle for the sample than the standard operation mode.

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