Near field imaging of a semiconductor laser by scanning probe microscopy without a photodetector

2013 ◽  
Vol 103 (5) ◽  
pp. 053120 ◽  
Author(s):  
M. S. Dunaevskiy ◽  
P. A. Alekseev ◽  
A. N. Baranov ◽  
A. M. Monakhov ◽  
R. Teissier ◽  
...  
Keyword(s):  
Semiconductor Laser ◽  
Scanning Probe Microscopy ◽  
Near Field ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Near Field Imaging ◽  
Field Imaging

Near-field imaging of surface plasmon on gold nano-dots fabricated by scanning probe lithography

2003 ◽  
Vol 209 (3) ◽  
pp. 236-240 ◽  
Author(s):  
J. Kim ◽  
J. Kim ◽  
K. I.-B. Song ◽  
S. Q. Lee ◽  
E. U. N.-K. Kim ◽  
...  
Keyword(s):  
Surface Plasmon ◽  
Near Field ◽  
Scanning Probe ◽  
Scanning Probe Lithography ◽  
Near Field Imaging ◽  
Field Imaging

Femtosecond laser aperturless near-field nanomachining of metals assisted by scanning probe microscopy

2003 ◽  
Vol 82 (8) ◽  
pp. 1146-1148 ◽  
Author(s):  
A. Chimmalgi ◽  
T. Y. Choi ◽  
C. P. Grigoropoulos ◽  
K. Komvopoulos
Keyword(s):  
Femtosecond Laser ◽  
Scanning Probe Microscopy ◽  
Near Field ◽  
Scanning Probe ◽  
Probe Microscopy

Near-Field Imaging of Cell Membranes in Liquid Enabled by Active Scanning Probe Mechanical Resonance Control

2016 ◽  
Vol 120 (37) ◽  
pp. 21138-21144 ◽  
Author(s):  
Kyoung-Duck Park ◽  
Markus B. Raschke ◽  
Min Jung Jang ◽  
Jung Hwa Kim ◽  
Beom-Hoan O ◽  
...  
Keyword(s):  
Cell Membranes ◽  
Near Field ◽  
Scanning Probe ◽  
Mechanical Resonance ◽  
Near Field Imaging ◽  
Active Scanning ◽  
Resonance Control ◽  
Field Imaging

scholarly journals Development of an Integrated Near-Field Acoustic Holography (NFAH) System on a Scanning Probe Microscopy Platform

2004 ◽  
Vol 10 (S02) ◽  
pp. 1104-1105
Author(s):  
Gajendra Shekhawat ◽  
Vinayak P Dravid
Keyword(s):  
Scanning Probe Microscopy ◽  
Near Field ◽  
Scanning Probe ◽  
Acoustic Holography ◽  
Probe Microscopy

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

scholarly journals Optically induced forces in scanning probe microscopy

Nanophotonics ◽  
2014 ◽  
Vol 3 (1-2) ◽  
pp. 105-116 ◽  
Author(s):  
Dana C. Kohlgraf-Owens ◽  
Sergey Sukhov ◽  
Léo Greusard ◽  
Yannick De Wilde ◽  
Aristide Dogariu
Keyword(s):  
Scanning Probe Microscopy ◽  
Near Field ◽  
Broad Band ◽  
Optical Force ◽  
Scanning Probe ◽  
Force Detection ◽  
Probe Microscopy ◽  
Practical Applications ◽  
Single Detector ◽  
Optically Induced

AbstractTypical measurements of light in the near-field utilize a photodetector such as a photomultiplier tube or a photodiode, which is placed remotely from the region under test. This kind of detection has many draw-backs including the necessity to detect light in the far-field, the influence of background propagating radiation, the relatively narrowband operation of photodetectors which complicates the operation over a wide wavelength range, and the difficulty in detecting radiation in the far-IR and THz. Here we review an alternative near-field light measurement technique based on the detection of optically induced forces acting on the scanning probe. This type of detection overcomes some of the above limitations, permitting true broad-band detection of light directly in the near-field with a single detector. The physical origins and the main characteristics of optical force detection are reviewed. In addition, intrinsic effects of the inherent optical forces for certain operation modalities of scanning probe microscopy are discussed. Finally, we review practical applications of optical force detection of interest for the broader field of the scanning probe microscopy.

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