Femtosecond laser aperturless near-field nanomachining of metals assisted by scanning probe microscopy

2003 ◽  
Vol 82 (8) ◽  
pp. 1146-1148 ◽  
Author(s):  
A. Chimmalgi ◽  
T. Y. Choi ◽  
C. P. Grigoropoulos ◽  
K. Komvopoulos
Keyword(s):  
Femtosecond Laser ◽  
Scanning Probe Microscopy ◽  
Near Field ◽  
Scanning Probe ◽  
Probe Microscopy

scholarly journals Development of an Integrated Near-Field Acoustic Holography (NFAH) System on a Scanning Probe Microscopy Platform

2004 ◽  
Vol 10 (S02) ◽  
pp. 1104-1105
Author(s):  
Gajendra Shekhawat ◽  
Vinayak P Dravid
Keyword(s):  
Scanning Probe Microscopy ◽  
Near Field ◽  
Scanning Probe ◽  
Acoustic Holography ◽  
Probe Microscopy

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

scholarly journals Optically induced forces in scanning probe microscopy

Nanophotonics ◽  
2014 ◽  
Vol 3 (1-2) ◽  
pp. 105-116 ◽  
Author(s):  
Dana C. Kohlgraf-Owens ◽  
Sergey Sukhov ◽  
Léo Greusard ◽  
Yannick De Wilde ◽  
Aristide Dogariu
Keyword(s):  
Scanning Probe Microscopy ◽  
Near Field ◽  
Broad Band ◽  
Optical Force ◽  
Scanning Probe ◽  
Force Detection ◽  
Probe Microscopy ◽  
Practical Applications ◽  
Single Detector ◽  
Optically Induced

AbstractTypical measurements of light in the near-field utilize a photodetector such as a photomultiplier tube or a photodiode, which is placed remotely from the region under test. This kind of detection has many draw-backs including the necessity to detect light in the far-field, the influence of background propagating radiation, the relatively narrowband operation of photodetectors which complicates the operation over a wide wavelength range, and the difficulty in detecting radiation in the far-IR and THz. Here we review an alternative near-field light measurement technique based on the detection of optically induced forces acting on the scanning probe. This type of detection overcomes some of the above limitations, permitting true broad-band detection of light directly in the near-field with a single detector. The physical origins and the main characteristics of optical force detection are reviewed. In addition, intrinsic effects of the inherent optical forces for certain operation modalities of scanning probe microscopy are discussed. Finally, we review practical applications of optical force detection of interest for the broader field of the scanning probe microscopy.

Near field imaging of a semiconductor laser by scanning probe microscopy without a photodetector

2013 ◽  
Vol 103 (5) ◽  
pp. 053120 ◽  
Author(s):  
M. S. Dunaevskiy ◽  
P. A. Alekseev ◽  
A. N. Baranov ◽  
A. M. Monakhov ◽  
R. Teissier ◽  
...  
Keyword(s):  
Semiconductor Laser ◽  
Scanning Probe Microscopy ◽  
Near Field ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Near Field Imaging ◽  
Field Imaging

Disentangling time in a near-field approach to scanning probe microscopy

Nanoscale ◽  
2011 ◽  
Vol 3 (9) ◽  
pp. 3589 ◽  
Author(s):  
Marco Farina ◽  
Agnese Lucesoli ◽  
Tiziana Pietrangelo ◽  
Andrea di Donato ◽  
Silvia Fabiani ◽  
...  
Keyword(s):  
Scanning Probe Microscopy ◽  
Near Field ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Field Approach

scholarly journals Optical near-field excitation at commercial scanning probe microscopy tips: a theoretical and experimental investigation

2014 ◽  
Vol 16 (6) ◽  
pp. 2289-2296 ◽  
Author(s):  
Christoph Huber ◽  
Andreas Trügler ◽  
Ulrich Hohenester ◽  
Yehiam Prior ◽  
Wolfgang Kautek
Keyword(s):  
Experimental Investigation ◽  
Scanning Probe Microscopy ◽  
Near Field ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Field Excitation

Mapping viscoelasticity, (specific) adhesion and near-field fluorescence of cellular structures with scanning probe microscopy

1995 ◽  
Vol 53 ◽  
pp. 720-721
Author(s):  
B.G. de Grooth ◽  
N.F. van Hulst ◽  
J. Greve ◽  
C.E.H. Berger ◽  
M.H.P. Moers ◽  
...  
Keyword(s):  
Scanning Probe Microscopy ◽  
Near Field ◽  
Operation Mode ◽  
Scanning Probe ◽  
Normal Operation ◽  
Probe Microscopy ◽  
Atomic Force ◽  
Standard Operation ◽  
High Resolution Images ◽  
Tapping Mode Afm

One of the major features of scanning probe microscopy is the ability to produce high-resolution images in air and in liquid. This makes these microscopes potentially very useful for the study of biological materials. Indeed the number of reports that use these microscopes, especially the atomic force microscope (AFM), has increased exponentially in the past decade. However, in order to become a routine apparatus that is able to image live processes at a scale of a few nanometers, the instrumentation of the AFM has to be improved. First of all, under normal operation, the movement of the tip across the surface of fragile biological structures such as cell membranes, often results in movement or even destruction of the object. Secondly, the lack of specificity of the AFM makes it difficult to identify the observed structures. Other problems include the low imaging speed and problems associated with the tip-sample convolution. Here we will report on attempts to improve the first two points: sample destruction and specificity.It has become clear recently that for operation in air the so-called tapping mode AFM is much more gentle for the sample than the standard operation mode.

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