scholarly journals Erratum: “Non-magnetic origin of spin Hall magnetoresistance-like signals in Pt films and epitaxial NiO/Pt bilayers” [Appl. Phys. Lett. 116, 022410 (2020)]

2020 ◽  
Vol 116 (7) ◽  
pp. 079901
Author(s):  
A. Churikova ◽  
D. Bono ◽  
B. Neltner ◽  
A. Wittmann ◽  
L. Scipioni ◽  
...  
Keyword(s):  
Magnetic Origin ◽  
Pt Films

scholarly journals Non-magnetic origin of spin Hall magnetoresistance-like signals in Pt films and epitaxial NiO/Pt bilayers

2020 ◽  
Vol 116 (2) ◽  
pp. 022410 ◽  
Author(s):  
A. Churikova ◽  
D. Bono ◽  
B. Neltner ◽  
A. Wittmann ◽  
L. Scipioni ◽  
...  
Keyword(s):  
Magnetic Origin ◽  
Pt Films

Surface Microstructure Evolution Upon Silicidation of Ni(Pt) and the Different Responses to Metal Etch

2013 ◽  
Author(s):  
Wentao Qin ◽  
Dorai Iyer ◽  
Jim Morgan ◽  
Carroll Casteel ◽  
Robert Watkins ◽  
...  
Keyword(s):  
Thin Film ◽  
Oxide Film ◽  
Microstructure Evolution ◽  
Depth Profiling ◽  
Surface Microstructure ◽  
The Difference ◽  
Surface Microstructures ◽  
Pt Films

Abstract Ni(5 at.%Pt ) films were silicided at a temperature below 400 °C and at 550 °C. The two silicidation temperatures had produced different responses to the subsequent metal etch. Catastrophic removal of the silicide was seen with the low silicidation temperature, while the desired etch selectivity was achieved with the high silicidation temperature. The surface microstructures developed were characterized with TEM and Auger depth profiling. The data correlate with both silicidation temperatures and ultimately the difference in the response to the metal etch. With the high silicidation temperature, there existed a thin Si-oxide film that was close to the surface and embedded with particles which contain metals. This thin film is expected to contribute significantly to the desired etch selectivity. The formation of this layer is interpreted thermodynamically.

Analysis on Resistance Change Mechanism of NiO-ReRAM Using Visualization Technique of Data Storage Area With Secondary Electron Image

2010 ◽  
Vol 1250 ◽  
Author(s):  
Kentaro Kinoshita ◽  
Tatsuya Makino ◽  
Yoda Takatoshi ◽  
Dobashi Kazufumi ◽  
Kishida Satoru
Keyword(s):  
Data Storage ◽  
Secondary Electron ◽  
High Resistance State ◽  
Secondary Electron Image ◽  
Resistance Change ◽  
Force Microscopy ◽  
Electron Image ◽  
Storage Area ◽  
Resistance State ◽  
Pt Films

AbstractBoth a low resistance state and a high resistance state which were written by the voltage application in a local region of NiO/Pt films by using conducting atomic force microscopy (C-AFM) were observed by using scanning electron microscope (SEM) and electron probe micro analysis (EPMA). The writing regions are distinguishable as dark areas in a secondary electron image and thus can be specified without using complicated sample fabrication process to narrow down the writing regions such as the photolithography technique. In addition, the writing regions were analyzed by using energy dispersive X-ray spectroscopy (EDS) mapping. No difference between the inside and outside of the writing regions is observed for all the mapped elements including C and Rh. Here, C and Rh are the most probable candidates for contamination which affect the secondary electron image. Therefore, our results suggested that the observed change in the contrast of the second electron image is related to the intrinsic change in the electronic state of the NiO film and a secondary electron yield is correlated to the physical properties of the film.

Plasma-assisted atomic layer deposition of conformal Pt films in high aspect ratio trenches

2017 ◽  
Vol 146 (5) ◽  
pp. 052818 ◽  
Author(s):  
I. J. M. Erkens ◽  
M. A. Verheijen ◽  
H. C. M. Knoops ◽  
W. Keuning ◽  
F. Roozeboom ◽  
...  
Keyword(s):  
Aspect Ratio ◽  
Atomic Layer Deposition ◽  
High Aspect Ratio ◽  
Atomic Layer ◽  
Layer Deposition ◽  
Pt Films

Thickness effects on the magnetic hysteresis of Co-Pt films

1993 ◽  
Vol 118 (3) ◽  
pp. 387-393 ◽  
Author(s):  
A. Tsoukatos ◽  
H. Wan ◽  
G.C. Hadjipanayis ◽  
Y.J. Zhang ◽  
M. Waite ◽  
...  
Keyword(s):  
Magnetic Hysteresis ◽  
Pt Films

Electrodeposition and hard magnetic properties of Co–Pt films in comparison to Fe–Pt films

2007 ◽  
Vol 314 (2) ◽  
pp. 116-121 ◽  
Author(s):  
K. Žužek Rožman ◽  
A. Krause ◽  
K. Leistner ◽  
S. Fähler ◽  
L. Schultz ◽  
...  
Keyword(s):  
Magnetic Properties ◽  
Pt Films ◽  
Hard Magnetic Properties

Magnetic origin of dielectric transition in BiFeO3

2014 ◽  
Author(s):  
J. Ray ◽  
A. K. Biswal ◽  
P. D. Babu ◽  
V. Siruguri ◽  
P. N. Vishwakarma
Keyword(s):  
Magnetic Origin ◽  
Dielectric Transition

Faceting of the Mo(111) surface by ultrathin Pd and Pt films

1995 ◽  
Vol 13 (3) ◽  
pp. 1484-1488 ◽  
Author(s):  
Jie Guan ◽  
Robert A. Campbell ◽  
Theodore E. Madey
Keyword(s):  
Pt Films

scholarly journals Thermally driven spin and charge currents in thin NiFe2O4/Pt films

2013 ◽  
Vol 87 (5) ◽  
Author(s):  
D. Meier ◽  
T. Kuschel ◽  
L. Shen ◽  
A. Gupta ◽  
T. Kikkawa ◽  
...  
Keyword(s):  
Thermally Driven ◽  
Pt Films

Residual Magnetic Moment Influences the Features of Fe3s XPS Spectrum: A Case Study

2021 ◽  
Vol 15 ◽  
Author(s):  
Ranjan K Sahu
Keyword(s):  
Magnetic Moment ◽  
Magnetic Domain ◽  
Anomalous Behavior ◽  
Spectral Features ◽  
Different Temperatures ◽  
Magnetic Origin ◽  
Xps Study ◽  
Increasing Temperature ◽  
Curie Temperature Tc

Background: Fe 3sXPS spectrumexhibits doublet peak instead of predicted singlet peak based on spin-orbit coupling theory. This anomalous behavior is considered to be magnetic origin. However, the effect of residual magnetic moment to the features of Fe3s doublet peakis not understood fully. Objective: This study aims to verify the effect of residual magnetic moment on the spectral features of Fe3s XPS spectrum of magnetic material. Method: As a case study, we have carried out a high temperature XPS study of the Fe 3s spectrum of magnetic domain aligned (MDA) sample with composition composed of SrFe10.8Al1.2O19. In addition, the XPS data have been compared with the data acquired at different temperatures of magnetic domain non-aligned (MDNA) sample. Results: The results show that the majority peak intensity and minority peak width of Fe 3s spectrum of MDA are smaller than those of the MDNA sample, and they increase systematically with increasing temperature. However, it is noted that the features of Fe3s spectrum of both MDA and MDNA samples are completely overlapped near and above the Curie temperature, Tc ~ 670K. Conclusion: The analysis of XPS data suggests that the residual magnetic moment influences the spectral features of Fe3s spectrum. These results provide evidences that it is important to consider the contribution of residual magnetic moment while deriving information from Fe 3s XPS spectrum of MDA sample.

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