Shifts in the flatband voltage of metal‐oxide‐silicon structure due to iodine in SiO2

1986 ◽  
Vol 48 (2) ◽  
pp. 177-179 ◽  
Author(s):  
L. Krusin‐Elbaum ◽  
G. A. Sai‐Halasz
2002 ◽  
Vol 27 (9) ◽  
pp. 713 ◽  
Author(s):  
Ching-Fuh Lin ◽  
Peng-Fei Chung ◽  
Miin-Jang Chen ◽  
Wei-Fang Su

2002 ◽  
Vol 36 (8) ◽  
pp. 889-894 ◽  
Author(s):  
G. G. Kareva ◽  
M. I. Vexler ◽  
I. V. Grekhov ◽  
A. F. Shulekin

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