Interface analysis by spectroscopic ellipsometry of Ga1−xAlxAs‐GaAs heterojunctions grown by metal organic vapor phase epitaxy

1983 ◽  
Vol 43 (3) ◽  
pp. 285-287 ◽  
Author(s):  
M. Erman ◽  
P. M. Frijlink
2009 ◽  
Vol 95 (1) ◽  
pp. 011910 ◽  
Author(s):  
Nebiha Ben Sedrine ◽  
Imed Moussa ◽  
Hedi Fitouri ◽  
Ahmed Rebey ◽  
Belgacem El Jani ◽  
...  

2000 ◽  
Vol 88 (7) ◽  
pp. 4085 ◽  
Author(s):  
S. Peters ◽  
T. Schmidtling ◽  
T. Trepk ◽  
U. W. Pohl ◽  
J.-T. Zettler ◽  
...  

2008 ◽  
Vol 1 ◽  
pp. 071102 ◽  
Author(s):  
Tomonari Shioda ◽  
Masakazu Sugiyama ◽  
Yukihiro Shimogaki ◽  
Yoshiaki Nakano

2010 ◽  
Vol 49 (10) ◽  
pp. 101001 ◽  
Author(s):  
Kimihito Ooyama ◽  
Katsuya Sugawara ◽  
Shinya Okuzaki ◽  
Hiroyuki Taketomi ◽  
Hideto Miyake ◽  
...  

2004 ◽  
Vol 267 (1-2) ◽  
pp. 140-144 ◽  
Author(s):  
A. Dadgar ◽  
N. Oleynik ◽  
D. Forster ◽  
S. Deiter ◽  
H. Witek ◽  
...  

2011 ◽  
Vol 23 (12) ◽  
pp. 774-776 ◽  
Author(s):  
A B Krysa ◽  
D G Revin ◽  
J P Commin ◽  
C N Atkins ◽  
K Kennedy ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document